Inventor · disambiguated record
Gary Cao
Also filed as: CAO GARY · CAO GARY X
4 granted patents·4 pending applications·27 citations·filing 2000–2007
74Inventor score
Top patents by PatentIndex Score
8 records- 0177US7285781B2Characterizing resist line shrinkage due to CD-SEM inspectionINTEL CORP·Filed 2004·Granted Oct 23, 2007·17 cites·39 claims
- 0262US7829852B2Device having etched feature with shrinkage carryoverINTEL CORP·Filed 2007·Granted Nov 9, 2010·1 cites·20 claims
- 0358US7211449B2Enhanced uniqueness for pattern recognitionINTEL CORP·Filed 2003·Granted May 1, 2007·6 cites·8 claims
- 0449US7514274B2Enhanced uniqueness for pattern recognitionINTEL CORP·Filed 2004·Granted Apr 7, 2009·3 cites·16 claims
- 0541US2007237415A1Local Processing (LP) of regions of arbitrary shape in images including LP based image captureCAO GARY X·Filed 2006·Application pending·0 cites
- 0640US2005173634A1Optical metrology target design for simultaneous measurement of multiple periodic structuresFiled 2005·Application pending·0 cites
- 0736US2003160163A1Optical metrology target design for simultaneous measurement of multiple periodic structuresFiled 2002·Application pending·0 cites
- 0833US2002085761A1Enhanced uniqueness for pattern recognitionFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →