Inventor · disambiguated record
Suresh Parameswaran
Also filed as: PARAMESWARAN SURESH · PARAMESWARAN SURESH P
12 granted patents·165 citations·filing 2004–2020
90Inventor score
Top patents by PatentIndex Score
12 records- 0196US10262911B1Circuit for and method of testing bond connections between a first die and a second dieXILINX INC·Filed 2016·Granted Apr 16, 2019·51 cites·20 claims
- 0294US11488887B1Thermal enablement of dies with impurity getteringXILINX INC·Filed 2020·Granted Nov 1, 2022·5 cites·9 claims
- 0391US11073550B1Test vehicle for package testingXILINX INC·Filed 2019·Granted Jul 27, 2021·5 cites·19 claims
- 0489US7142477B1Memory interface system and method for reducing cycle time of sequential read and write accesses using separate address and data busesCYPRESS SEMICONDUCTOR CORP·Filed 2004·Granted Nov 28, 2006·54 cites·15 claims
- 0587US7728619B1Circuit and method for cascading programmable impedance matching in a multi-chip systemCYPRESS SEMICONDUCTOR CORP·Filed 2008·Granted Jun 1, 2010·17 cites·18 claims
- 0675US7403446B1Single late-write for standard synchronous SRAMsCYPRESS SEMICONDUCTOR CORP·Filed 2005·Granted Jul 22, 2008·10 cites·15 claims
- 0770US8810269B2Method of testing a semiconductor structureXILINX INC·Filed 2012·Granted Aug 19, 2014·3 cites·19 claims
- 0867US8040164B2Circuits and methods for programming integrated circuit input and output impedancesCYPRESS SEMICONDUCTOR CORP·Filed 2008·Granted Oct 18, 2011·3 cites·16 claims
- 0963US7535772B1Configurable data path architecture and clocking schemeCYPRESS SEMICONDUCTOR CORP·Filed 2004·Granted May 19, 2009·13 cites·7 claims
- 1060US7719908B1Memory having read disturb test modeCYPRESS SEMICONDUCTOR CORP·Filed 2007·Granted May 18, 2010·4 cites·18 claims
- 1145US10620644B1Systems and methods for on-die heat generation and temperature sensingXILINX INC·Filed 2018·Granted Apr 14, 2020·0 cites·20 claims
- 1243US10302504B1On-die temperature sensing and digitization systemXILINX INC·Filed 2017·Granted May 28, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →