Inventor · disambiguated record
Torsten Jähnke
Also filed as: JAEHNKE TORSTEN · JAHNKE TORSTEN · JÄHNKE TORSTEN
11 granted patents·2 pending applications·135 citations·filing 2002–2020
85Inventor score
Top patents by PatentIndex Score
13 records- 0194US7022985B2Apparatus and method for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2002·Granted Apr 4, 2006·122 cites·18 claims
- 0272US8381311B2Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe systemJPK INSTRUMENTS AG·Filed 2008·Granted Feb 19, 2013·6 cites·20 claims
- 0357US8368017B2Method for the operation of a measurement system with a scanning probe microscope and a measurement systemJPK INSTRUMENTS AG·Filed 2006·Granted Feb 5, 2013·3 cites·20 claims
- 0455US7473894B2Apparatus and method for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2006·Granted Jan 6, 2009·4 cites·22 claims
- 0552US7971266B2Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscopeJPK INSTRUMENTS AG·Filed 2009·Granted Jun 28, 2011·0 cites·28 claims
- 0646US7934323B2Method and a device for the positioning of a displaceable component in an examining systemJPK INSTRUMENTS AG·Filed 2006·Granted May 3, 2011·0 cites·21 claims
- 0743US2010031403A1Heat Coupling DeviceNAMBITION GMBH·Filed 2006·Application pending·0 cites
- 0840US10539591B2Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscopeBRUKER NANO GMBH·Filed 2018·Granted Jan 21, 2020·0 cites·13 claims
- 0938US9080937B2Apparatus and a method for investigating a sample by means of several investigation methodsJPK INSTRUMENTS AG·Filed 2013·Granted Jul 14, 2015·0 cites·14 claims
- 1034US8898809B2Method and apparatus for the combined analysis of a sample with objects to be analyzedMÜLLER TORSTEN·Filed 2008·Granted Nov 25, 2014·0 cites·8 claims
- 1134US2022244287A1Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for OperatingBRUKER NANO GMBH·Filed 2020·Application pending·0 cites
- 1233US8505109B2Measuring probe device for a probe microscope, measuring cell and scanning probe microscopeJAEHNKE TORSTEN·Filed 2008·Granted Aug 6, 2013·0 cites·13 claims
- 1331US8769711B2Method for examining a measurement object, and apparatusJÄHNKE TORSTEN·Filed 2006·Granted Jul 1, 2014·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →