Inventor · disambiguated record
Yoshiro Goto
Also filed as: GOTO YOSHIRO
19 granted patents·2 pending applications·371 citations·filing 1978–2014
95Inventor score
Top patents by PatentIndex Score
21 records- 0187US8070316B2Lighting apparatus with LEDsURANO YOUJI·Filed 2006·Granted Dec 6, 2011·37 cites·12 claims
- 0285US4177379ABack-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electronsFUJITSU LTD·Filed 1978·Granted Dec 4, 1979·22 cites·12 claims
- 0381US5719430ABuried-channel MOS transistor and process of producing sameNEC CORP·Filed 1996·Granted Feb 17, 1998·45 cites·13 claims
- 0478US6503800B2Manufacturing method of semiconductor device having different gate oxide thicknessNEC CORP·Filed 2001·Granted Jan 7, 2003·24 cites·5 claims
- 0577US5331275AProbing device and system for testing an integrated circuitFUJITSU LTD·Filed 1992·Granted Jul 19, 1994·43 cites·51 claims
- 0676US5614432AMethod for manufacturing LDD type MIS deviceNEC CORP·Filed 1995·Granted Mar 25, 1997·41 cites·9 claims
- 0772US5916458AProduction of optical module assemblyFUJITSU LTD·Filed 1996·Granted Jun 29, 1999·38 cites·32 claims
- 0868US6388504B1Integrated circuit device with switching between active mode and standby mode controlled by digital circuitNEC CORP·Filed 2000·Granted May 14, 2002·12 cites·10 claims
- 0968US6184094B1Method for producing semiconductor deviceNEC CORP·Filed 2000·Granted Feb 6, 2001·14 cites·7 claims
- 1058US6664148B2Integrated circuit device with switching between active mode and standby mode controlled by digital circuitNEC CORP·Filed 2002·Granted Dec 16, 2003·7 cites·12 claims
- 1157US5999005AVoltage and displacement measuring apparatus and probeFUJITSU LTD·Filed 1997·Granted Dec 7, 1999·18 cites·7 claims
- 1255US5933737ABuried-channel MOS transistor and process of producing sameNEC CORP·Filed 1997·Granted Aug 3, 1999·14 cites·10 claims
- 1353US5306936ANon-volatile semiconductor memory device having oxynitride film for preventing charge in floating gate from lossNEC CORP·Filed 1993·Granted Apr 26, 1994·21 cites·7 claims
- 1446US5677635AVoltage and displacement measuring apparatus and probeFUJITSU LTD·Filed 1994·Granted Oct 14, 1997·10 cites·10 claims
- 1544US6521500B1Semiconductor device and method of manufacturing the sameNEC CORP·Filed 2000·Granted Feb 18, 2003·2 cites·8 claims
- 1643US5550479ASignal measuring apparatus and signal measuring methodFUJITSU LTD·Filed 1995·Granted Aug 27, 1996·11 cites·15 claims
- 1743US2014268832A1Illumination light source and lighting apparatusPANASONIC CORP·Filed 2014·Application pending·0 cites
- 1837US5733818AMethod for fabricating semiconductor device with planarization step using CMPNEC CORP·Filed 1996·Granted Mar 31, 1998·6 cites·5 claims
- 1935US2003183880A1Semiconductor device covering transistor and resistance with capacitor materialFiled 2003·Application pending·0 cites
- 2034US4755749AStrobo electron beam apparatusFUJITSU LTD·Filed 1986·Granted Jul 5, 1988·5 cites·7 claims
- 2131US4484077AExposure system and method using an electron beamFUJITSU LTD·Filed 1980·Granted Nov 20, 1984·1 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →