Inventor · disambiguated record
Detlef Schupp
Also filed as: SCHUPP DETLEF
2 granted patents·9 citations·filing 2004–2008
54Inventor score
Top patents by PatentIndex Score
2 records- 0167US7768637B2Method for acquiring high-resolution images of defects on the upper surface of the wafer edgeVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Granted Aug 3, 2010·6 cites·18 claims
- 0249US7623698B2Method of learning a knowledge-based database used in automatic defect classificationKLA TENCOR MIE GMBH·Filed 2004·Granted Nov 24, 2009·3 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →