Inventor · disambiguated record
Yasuko Aoki
Also filed as: AOKI YASUKO
10 granted patents·1 pending application·124 citations·filing 1992–2015
89Inventor score
Top patents by PatentIndex Score
11 records- 0188US7705302B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 27, 2010·13 cites·12 claims
- 0287US8629395B2Charged particle beam apparatusMORISHITA HIDEO·Filed 2011·Granted Jan 14, 2014·10 cites·17 claims
- 0383US9506876B2X-ray inspection device, inspection method, and X-ray detectorHITACHI HIGH TECH CORP·Filed 2012·Granted Nov 29, 2016·4 cites·12 claims
- 0478US5933473ANon-destructive inspection apparatus and inspection system using itHITACHI LTD·Filed 1997·Granted Aug 3, 1999·39 cites·16 claims
- 0577US9164042B2Device for detecting foreign matter and method for detecting foreign matterAIKO KENJI·Filed 2012·Granted Oct 20, 2015·2 cites·21 claims
- 0672US5398268ANuclear power plant having a water chemistry control system for a primary cooling system thereof and an operation method thereofHITACHI LTD·Filed 1992·Granted Mar 14, 1995·18 cites·23 claims
- 0765US6333962B1Non-destructive inspection apparatus and inspection system using itHITACHI LTD·Filed 1999·Granted Dec 25, 2001·21 cites·4 claims
- 0864US8455823B2Charged particle beam deviceICHIMURA TAKASHI·Filed 2009·Granted Jun 4, 2013·2 cites·18 claims
- 0964US7342241B2Method and apparatus for electron-beam lithographyHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 11, 2008·2 cites·12 claims
- 1053US6049586ANon-destructive inspection apparatus and inspection system using itHITACHI LTD·Filed 1999·Granted Apr 11, 2000·13 cites·6 claims
- 1138US2018209924A1Defect Determining Method and X-Ray Inspection DeviceHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →