Inventor · disambiguated record
Jeffrey B. Bindell
Also filed as: BINDELL JEFFREY B · BINDELL JEFFREY BRUCE
12 granted patents·1 pending application·209 citations·filing 1977–2001
92Inventor score
Files withAGERE SYST GUARDIAN CORP4LUCENT TECHNOLOGIES INC3AT & T BELL LAB2BELL TELEPHONE LABOR INC2AGERE SYSTEMS INC1
Top patents by PatentIndex Score
13 records- 0183US4107835AFabrication of semiconductive devicesBELL TELEPHONE LABOR INC·Filed 1977·Granted Aug 22, 1978·31 cites·9 claims
- 0276US6250143B1Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-sectionAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 26, 2001·50 cites·12 claims
- 0368US6727720B2Probe having a microstyletAGERE SYSTEMS INC·Filed 2001·Granted Apr 27, 2004·14 cites·11 claims
- 0461US4111783ATriode sputtering systemBELL TELEPHONE LABOR INC·Filed 1977·Granted Sep 5, 1978·15 cites·3 claims
- 0554US4948407AProton exchange method of forming waveguides in LiNbO3AT & T BELL LAB·Filed 1989·Granted Aug 14, 1990·18 cites·6 claims
- 0652US6297503B1Method of detecting semiconductor defectsLUCENT TECHNOLOGIES INC·Filed 1999·Granted Oct 2, 2001·16 cites·22 claims
- 0750US6362475B1Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced therebyAGERE SYST GUARDIAN CORP·Filed 1999·Granted Mar 26, 2002·14 cites·20 claims
- 0848US6405584B1Probe for scanning probe microscopy and related methodsAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 18, 2002·14 cites·43 claims
- 0947US6178653B1Probe tip locatorLUCENT TECHNOLOGIES INC·Filed 1998·Granted Jan 30, 2001·13 cites·32 claims
- 1047US5804460ALinewidth metrology of integrated circuit structuresLUCENT TECHNOLOGIES INC·Filed 1997·Granted Sep 8, 1998·17 cites·10 claims
- 1140US5194117ALithium niobate etchantAT & T BELL LAB·Filed 1991·Granted Mar 16, 1993·7 cites·12 claims
- 1235US6425189B1Probe tip locator having improved marker arrangement for reduced bit encoding errorAGERE SYST GUARDIAN CORP·Filed 2000·Granted Jul 30, 2002·0 cites·21 claims
- 1333US2002062572A1Method of determining the shape of a probe for a stylus profilometerFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →