Inventor · disambiguated record
Tony M. Lindenberg
Also filed as: LINDENBERG TONY M · Lindenberg Tony
13 granted patents·21 citations·filing 2014–2020
87Inventor score
Files withMICRON TECHNOLOGY INC13
Top patents by PatentIndex Score
13 records- 0191US9881971B2Memory arraysMICRON TECHNOLOGY INC·Filed 2014·Granted Jan 30, 2018·10 cites·15 claims
- 0285US9362494B2Array of cross point memory cells and methods of forming an array of cross point memory cellsMICRON TECHNOLOGY INC·Filed 2014·Granted Jun 7, 2016·4 cites·24 claims
- 0382US9923139B2Conductive hard mask for memory device formationMICRON TECHNOLOGY INC·Filed 2016·Granted Mar 20, 2018·4 cites·21 claims
- 0475US10103326B2Conductive hard mask for memory device formationMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 16, 2018·2 cites·20 claims
- 0569US9899451B2Array of cross point memory cells and methods of forming an array of cross point memory cellsMICRON TECHNOLOGY INC·Filed 2016·Granted Feb 20, 2018·1 cites·20 claims
- 0662US11402426B2Inductive testing probe apparatus for testing semiconductor die and related systems and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 0758US10424618B2Array of cross point memory cells and methods of forming an array of cross point memory cellsMICRON TECHNOLOGY INC·Filed 2017·Granted Sep 24, 2019·0 cites·20 claims
- 0856US11094684B2Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topographyMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 17, 2021·0 cites·20 claims
- 0954US10852344B2Inductive testing probe apparatus for testing semiconductor die and related systems and methodsMICRON TECHNOLOGY INC·Filed 2017·Granted Dec 1, 2020·0 cites·30 claims
- 1054US10741753B2Conductive hard mask for memory device formationMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 11, 2020·0 cites·16 claims
- 1152US10403618B2Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topographyMICRON TECHNOLOGY INC·Filed 2017·Granted Sep 3, 2019·0 cites·17 claims
- 1252US10332934B2Memory arrays and methods of forming memory arraysMICRON TECHNOLOGY INC·Filed 2017·Granted Jun 25, 2019·0 cites·18 claims
- 1346US9401285B2Chemical mechanical planarization topography control via implantMICRON TECHNOLOGY INC·Filed 2014·Granted Jul 26, 2016·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →