Inventor · disambiguated record
Jang-Shiang Tsai
Also filed as: TSAI JANG-SHIANG
10 granted patents·1 pending application·30 citations·filing 2004–2019
85Inventor score
Top patents by PatentIndex Score
11 records- 0188US9153479B2Method of preventing a pattern collapseTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 6, 2015·7 cites·21 claims
- 0284US9502287B2Method of preventing pattern collapseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Nov 22, 2016·3 cites·20 claims
- 0378US8927353B2Fin field effect transistor and method of forming the sameHSU JU-WANG·Filed 2007·Granted Jan 6, 2015·8 cites·17 claims
- 0468US10483397B2Fin field effect transistor and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Nov 19, 2019·1 cites·20 claims
- 0566US7029992B2Low oxygen content photoresist stripping process for low dielectric constant materialsTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Apr 18, 2006·9 cites·17 claims
- 0664US11355642B2Method for manufacturing semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 7, 2022·0 cites·20 claims
- 0764US11043453B2Method of preventing pattern collapseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 22, 2021·0 cites·20 claims
- 0856US10515895B2Method of preventing pattern collapseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 24, 2019·0 cites·20 claims
- 0950US7598176B2Method for photoresist stripping and treatment of low-k dielectric materialTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 6, 2009·2 cites·20 claims
- 1045US7400401B2Measuring low dielectric constant film properties during processingTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Jul 15, 2008·0 cites·17 claims
- 1142US2008122107A1Poly silicon hard maskTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →