Inventor · disambiguated record
K. Reed Gleason
Also filed as: GLEASON K R · GLEASON K REED
46 granted patents·3 pending applications·1,582 citations·filing 1978–2015
99Inventor score
Files withCASCADE MICROTECH INC43GLEASON K R1GLEASON K REED1SHARP LAB OF AMERICA INC1SMITH KENNETH R1
Top patents by PatentIndex Score
49 records- 0198US7271603B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2006·Granted Sep 18, 2007·51 cites·53 claims
- 0298US5914613AMembrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 1996·Granted Jun 22, 1999·200 cites·15 claims
- 0397US7109731B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2005·Granted Sep 19, 2006·40 cites·15 claims
- 0497US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 0597US4849689AMicrowave wafer probe having replaceable probe tipCASCADE MICROTECH INC·Filed 1988·Granted Jul 18, 1989·148 cites·12 claims
- 0696US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 0796US6608496B1Reference transmission line junction for probing deviceCASCADE MICROTECH INC·Filed 2000·Granted Aug 19, 2003·63 cites·6 claims
- 0895US5869975ASystem for evaluating probing networks that have multiple probing endsCASCADE MICROTECH INC·Filed 1997·Granted Feb 9, 1999·90 cites·12 claims
- 0995US5561377ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1995·Granted Oct 1, 1996·84 cites·12 claims
- 1095US5045781AHigh-frequency active probe having replaceable contact needlesCASCADE MICROTECH INC·Filed 1991·Granted Sep 3, 1991·123 cites·6 claims
- 1194US7893704B2Membrane probing structure with laterally scrubbing contactsCASCADE MICROTECH INC·Filed 2009·Granted Feb 22, 2011·18 cites·34 claims
- 1294US7304488B2Shielded probe for high-frequency testing of a device under testCASCADE MICROTECH INC·Filed 2006·Granted Dec 4, 2007·19 cites·1 claims
- 1393US8451017B2Membrane probing method using improved contactGLEASON K REED·Filed 2010·Granted May 28, 2013·21 cites·21 claims
- 1493US7759953B2Active wafer probeCASCADE MICROTECH INC·Filed 2008·Granted Jul 20, 2010·16 cites·5 claims
- 1593US7321233B2System for evaluating probing networksCASCADE MICROTECH INC·Filed 2007·Granted Jan 22, 2008·14 cites·17 claims
- 1693US5973505ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1998·Granted Oct 26, 1999·61 cites·15 claims
- 1793US5659255AMethod of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channelsCASCADE MICROTECH INC·Filed 1996·Granted Aug 19, 1997·64 cites·10 claims
- 1892US6130544ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1999·Granted Oct 10, 2000·54 cites·13 claims
- 1991US7427868B2Active wafer probeCASCADE MICROTECH INC·Filed 2004·Granted Sep 23, 2008·41 cites·5 claims
- 2091US7057404B2Shielded probe for testing a device under testSHARP LAB OF AMERICA INC·Filed 2003·Granted Jun 6, 2006·31 cites·45 claims
- 2191US6437584B1Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2000·Granted Aug 20, 2002·33 cites·83 claims
- 2290US7498829B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 3, 2009·12 cites·47 claims
- 2390US7482823B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jan 27, 2009·11 cites·33 claims
- 2489US7501842B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 10, 2009·11 cites·53 claims
- 2588US7898273B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2009·Granted Mar 1, 2011·10 cites·29 claims
- 2688US7436194B2Shielded probe with low contact resistance for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·10 cites·20 claims
- 2787US7518387B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·9 cites·55 claims
- 2886US7541821B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2007·Granted Jun 2, 2009·8 cites·34 claims
- 2986US7489149B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Feb 10, 2009·8 cites·17 claims
- 3083US5012186AElectrical probe with contact force protectionCASCADE MICROTECH INC·Filed 1990·Granted Apr 30, 1991·50 cites·16 claims
- 3182US9874585B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameCASCADE MICROTECH INC·Filed 2015·Granted Jan 23, 2018·2 cites·11 claims
- 3281US9099449B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameCASCADE MICROTECH INC·Filed 2015·Granted Aug 4, 2015·2 cites·23 claims
- 3381US6307387B1Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 1998·Granted Oct 23, 2001·28 cites·83 claims
- 3480US7164279B2System for evaluating probing networksCASCADE MICROTECH INC·Filed 2005·Granted Jan 16, 2007·5 cites·13 claims
- 3579US7618590B2Fluid dispensing systemCASCADE MICROTECH INC·Filed 2006·Granted Nov 17, 2009·13 cites·2 claims
- 3676US6927585B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2002·Granted Aug 9, 2005·11 cites·82 claims
- 3771US9372214B2High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the sameSTRID ERIC W·Filed 2012·Granted Jun 21, 2016·4 cites·35 claims
- 3871US7550983B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2006·Granted Jun 23, 2009·3 cites·17 claims
- 3968US5006793AHigh-frequency active probe having replaceable contact needlesCASCADE MICROTECH INC·Filed 1989·Granted Apr 9, 1991·23 cites·4 claims
- 4063US7394269B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jul 1, 2008·2 cites·12 claims
- 4160US6987398B2System for evaluating probing networksCASCADE MICROTECH INC·Filed 2004·Granted Jan 17, 2006·4 cites·11 claims
- 4256US6803779B2Interconnect assembly for use in evaluating probing networksCASCADE MICROTECH INC·Filed 2003·Granted Oct 12, 2004·3 cites·9 claims
- 4354US4231058ATungsten-titanium-chromium/gold semiconductor metallizationUS NAVY·Filed 1978·Granted Oct 28, 1980·12 cites·6 claims
- 4453US4891612AOverlap interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignmentCASCADE MICROTECH INC·Filed 1988·Granted Jan 2, 1990·11 cites·10 claims
- 4550US5264788AAdjustable strap implemented return line for a probe stationCASCADE MICROTECH INC·Filed 1992·Granted Nov 23, 1993·15 cites·11 claims
- 4649US2010253377A1Active wafer probeCASCADE MICROTECH INC·Filed 2010·Application pending·0 cites
- 4748US8970240B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameSMITH KENNETH R·Filed 2011·Granted Mar 3, 2015·0 cites·18 claims
- 4848US2007278421A1Sample preparation techniqueGLEASON K R·Filed 2007·Application pending·0 cites
- 4937US2013015871A1Systems, devices, and methods for two-sided testing of electronic devicesCASCADE MICROTECH INC·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →