Inventor · disambiguated record
Tsutomu Negishi
Also filed as: NEGISHI TSUTOMU
20 granted patents·5 pending applications·747 citations·filing 1986–2024
95Inventor score
Top patents by PatentIndex Score
25 records- 0192US11837437B2Specimen machining device and information provision methodJEOL LTD·Filed 2022·Granted Dec 5, 2023·2 cites·9 claims
- 0291US6321266B1Input/output apparatus connected to a plurality of host computers via a networkCANON KK·Filed 1996·Granted Nov 20, 2001·155 cites·51 claims
- 0389US5740028AInformation input/output control device and method thereforCANON KK·Filed 1997·Granted Apr 14, 1998·106 cites·21 claims
- 0487US6177934B1Server device and image processing deviceCANON KK·Filed 1994·Granted Jan 23, 2001·78 cites·23 claims
- 0585US5859956AInformation processing device and information processing methodCANON KK·Filed 1997·Granted Jan 12, 1999·103 cites·5 claims
- 0685US4855133AComposition for attracting fliesEARTH CHEMICAL CO·Filed 1986·Granted Aug 8, 1989·41 cites·9 claims
- 0783US5996029AInformation input/output control apparatus and method for indicating which of at least one information terminal device is able to execute a functional operation based on environmental informationCANON KK·Filed 1996·Granted Nov 30, 1999·140 cites·15 claims
- 0881US6444991B1Scanning charged-particle beam instrumentJEOL LTD·Filed 2000·Granted Sep 3, 2002·16 cites·4 claims
- 0978US10930467B2Sample holder system and sample observation apparatusJEOL LTD·Filed 2018·Granted Feb 23, 2021·2 cites·5 claims
- 1076US7154616B2Application charging system, information processing apparatus, and control method therefor and memory medium storing program thereforCANON KK·Filed 2001·Granted Dec 26, 2006·17 cites·6 claims
- 1176US6787770B2Method of inspecting holes using charged-particle beamJEOL LTD·Filed 2002·Granted Sep 7, 2004·13 cites·20 claims
- 1273US12500059B2Sample milling apparatus, shield plate, and sample milling methodJEOL LTD·Filed 2023·Granted Dec 16, 2025·0 cites·13 claims
- 1368US6804016B2Control apparatus for a scanner/printerCANON KK·Filed 1997·Granted Oct 12, 2004·35 cites·20 claims
- 1467US9507139B2Specimen holder, specimen preparation device, and positioning methodJEOL LTD·Filed 2015·Granted Nov 29, 2016·2 cites·10 claims
- 1567US5130540AMethod and apparatus for automatic focusing of scanning electron microscopeJEOL LTD·Filed 1991·Granted Jul 14, 1992·20 cites·7 claims
- 1666US2024248014A1Specimen Holder, Specimen Holder Set, and Specimen Preparation MethodJEOL LTD·Filed 2024·Application pending·0 cites
- 1765US5834774AScanning electron microscopeJEOL LTD·Filed 1997·Granted Nov 10, 1998·17 cites·10 claims
- 1861US2024331970A1Sample Holder and Sample Processing ApparatusJEOL LTD·Filed 2024·Application pending·0 cites
- 1959US2024208762A1Apparatus and Method for Fabrication of Shield PlateJEOL LTD·Filed 2023·Application pending·0 cites
- 2055US2011008264A1Method for repelling a rodent, method for capturing a rodent and rodent repellentEARTH CHEMICAL CO·Filed 2007·Application pending·0 cites
- 2154US12476071B2Specimen machining device and specimen machining methodJEOL LTD·Filed 2022·Granted Nov 18, 2025·0 cites·9 claims
- 2248US11043355B2Vacuum cooling apparatus and ion milling apparatusJEOL LTD·Filed 2019·Granted Jun 22, 2021·0 cites·5 claims
- 2348US8716683B2Ion beam processing system and sample processing methodJEOL LTD·Filed 2012·Granted May 6, 2014·0 cites·5 claims
- 2438US2015311028A1Apparatus and Method for Sample PreparationJEOL LTD·Filed 2015·Application pending·0 cites
- 2537US6888137B1Instrument and method for observing selected stored images acquired from a scanning charged-particle beamJEOL LTD·Filed 2000·Granted May 3, 2005·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →