Inventor · disambiguated record
Kangping Zhang
Also filed as: ZHANG KANGPING
2 granted patents·2 citations·filing 2008–2010
40Inventor score
Technology areasG01R
Files withSILICON STORAGE TECH INC2
Top patents by PatentIndex Score
2 records- 0150US7728361B2Method of testing an integrated circuit die, and an integrated circuit dieSILICON STORAGE TECH INC·Filed 2008·Granted Jun 1, 2010·2 cites·4 claims
- 0243US7851273B2Method of testing an integrated circuit die, and an integrated circuit dieSILICON STORAGE TECH INC·Filed 2010·Granted Dec 14, 2010·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →