Inventor · disambiguated record
Tadao Mimura
Also filed as: MIMURA TADAO
25 granted patents·1 pending application·656 citations·filing 1990–2006
97Inventor score
Top patents by PatentIndex Score
26 records- 0193US6236042B1Method and apparatus for direct coupling of liquid chromatograph and mass spectrometer, liquid chromatography-mass spectrometry, and liquid chromatograph-mass spectrometerHITACHI LTD·Filed 2000·Granted May 22, 2001·34 cites·4 claims
- 0293US5581081AMethod and apparatus for direct coupling of liquid chromatograph and mass spectrometer, liquid chromatograph-mass spectrometry, and liquid chromatograph mass spectrometerHITACHI LTD·Filed 1994·Granted Dec 3, 1996·55 cites·24 claims
- 0393USD347396SMass spectrometer combined with liquid chromatographHITACHI LTD·Filed 1993·Granted May 31, 1994·43 cites·1 claims
- 0492US7161141B2Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate massHITACHI HIGH TECH CORP·Filed 2005·Granted Jan 9, 2007·15 cites·7 claims
- 0588US6005245AMethod and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis regionHITACHI LTD·Filed 1997·Granted Dec 21, 1999·53 cites·23 claims
- 0686US5668370AAutomatic ionization mass spectrometer with a plurality of atmospheric ionization sourcesHITACHI LTD·Filed 1996·Granted Sep 16, 1997·76 cites·11 claims
- 0785US5298744AMass spectrometerHITACHI LTD·Filed 1993·Granted Mar 29, 1994·45 cites·15 claims
- 0883US5663560AMethod and apparatus for mass analysis of solution sampleHITACHI LTD·Filed 1995·Granted Sep 2, 1997·42 cites·69 claims
- 0982US6759652B2Ion trap mass analyzing apparatusHITACHI HIGH TECH CORP·Filed 2002·Granted Jul 6, 2004·16 cites·12 claims
- 1082US6339218B1Method and apparatus for direct coupling of liquid chromatograph and mass spectrometer, liquid chromatography—mass spectrometry, and liquid chromatograph mass spectrometerHITACHI LTD·Filed 1999·Granted Jan 15, 2002·26 cites·4 claims
- 1181US6977373B2Ion trap mass analyzing apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Dec 20, 2005·14 cites·5 claims
- 1281US6157030AIon trap mass spectrometerHITACHI LTD·Filed 1998·Granted Dec 5, 2000·39 cites·21 claims
- 1372US5789747AThree dimensional quadrupole mass spectrometry and mass spectrometerHITACHI LTD·Filed 1997·Granted Aug 4, 1998·24 cites·7 claims
- 1471US6683303B2Ion trap mass spectrometer and spectrometryHITACHI LTD·Filed 2002·Granted Jan 27, 2004·8 cites·15 claims
- 1571US5789746ALiquid chromatograph mass spectrometry and liquid chromatograph mass spectrometerHITACHI LTD·Filed 1997·Granted Aug 4, 1998·35 cites·12 claims
- 1668US4996424AAtmospheric pressure ionization mass spectrometerHITACHI LTD·Filed 1990·Granted Feb 26, 1991·19 cites·8 claims
- 1767US5859432AMethod and apparatus for direct coupling of liquid chromatograph and mass spectrometer liquid, chromatography--mass spectrometry, and liquid chromatograph--mass spectrometerHITACHI LTD·Filed 1996·Granted Jan 12, 1999·14 cites·35 claims
- 1866US5051583AAtmospheric pressure ionization type mass spectrometerHITACHI LTD·Filed 1990·Granted Sep 24, 1991·22 cites·3 claims
- 1962US5240616ALiquid chromatograph-direct coupled mass spectrometerHITACHI LTD·Filed 1990·Granted Aug 31, 1993·16 cites·10 claims
- 2057US5633496AMass spectrometry apparatusHITACHI LTD·Filed 1995·Granted May 27, 1997·19 cites·21 claims
- 2156US2007069121A1Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate massHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 2255US5612534AAtmospheric pressure ionization mass spectrometerHITACHI LTD·Filed 1996·Granted Mar 18, 1997·11 cites·17 claims
- 2354US5532483AMass spectrometer and ion sourceHITACHI LTD·Filed 1995·Granted Jul 2, 1996·10 cites·11 claims
- 2450US5986260AMass analyzerHITACHI LTD·Filed 1997·Granted Nov 16, 1999·9 cites·18 claims
- 2545US5422482AMass spectrometric apparatusHITACHI LTD·Filed 1994·Granted Jun 6, 1995·8 cites·11 claims
- 2631US5567938AMass spectrometerHITACHI LTD·Filed 1994·Granted Oct 22, 1996·3 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →