Inventor · disambiguated record
Yun-Chi Yang
Also filed as: YANG YUN · YANG YUN C · YANG YUN-CHI
10 granted patents·6 pending applications·56 citations·filing 2000–2020
85Inventor score
Files withMACRONIX INT CO LTD8YANG YUN-CHI3MORNINGCORE TECH CO CHINA1UNITED MICROELECTRONICS CORP1WANG WAI S1
Top patents by PatentIndex Score
16 records- 0182US7754611B2Chemical mechanical polishing processMACRONIX INT CO LTD·Filed 2006·Granted Jul 13, 2010·12 cites·38 claims
- 0279US6326220B1Method for determining near-surface doping concentrationMACRONIX INT CO LTD·Filed 2000·Granted Dec 4, 2001·30 cites·21 claims
- 0360US7589551B1On-wafer AC stress test circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Sep 15, 2009·4 cites·15 claims
- 0455US7341910B2Method for forming a flash memory by using a microcrystalline polysilicon layer as a floating gateMACRONIX INT CO LTD·Filed 2002·Granted Mar 11, 2008·4 cites·6 claims
- 0550US7659167B2Method for improving the performance of flash memory by using microcrystalline silicon film as a floating gateMACRONIX INT CO LTD·Filed 2006·Granted Feb 9, 2010·0 cites·4 claims
- 0649US7199018B2Plasma assisted pre-planarization processMACRONIX INT CO LTD·Filed 2004·Granted Apr 3, 2007·2 cites·9 claims
- 0748US6790746B1Method for improvement of edge breakdown caused by edge electrical field at a tunnel oxide of a high-density flash memory by a shielded bird's beakMACRONIX INT CO LTD·Filed 2003·Granted Sep 14, 2004·4 cites·15 claims
- 0845US7544618B2Two-step chemical mechanical polishing processMACRONIX INT CO LTD·Filed 2006·Granted Jun 9, 2009·0 cites·18 claims
- 0939US2006252267A1Topology-selective oxide CMPWANG WAI S·Filed 2005·Application pending·0 cites
- 1038US11927631B2Test method and apparatus of communication chip, device and mediumMORNINGCORE TECH CO CHINA·Filed 2020·Granted Mar 12, 2024·0 cites·4 claims
- 1138US2005037578A1[method for forming an oxide/ nitride/oxide stacked layer]Filed 2003·Application pending·0 cites
- 1235US2005084990A1Endpoint detection in manufacturing semiconductor deviceFiled 2003·Application pending·0 cites
- 1335US2004147136A1Method for making the gate dielectric layer by oxygen radicals and hydroxyl radicals mixtureMACRONIX INT CO LTD·Filed 2003·Application pending·0 cites
- 1433US2009278170A1Semiconductor device and manufacturing method thereofYANG YUN-CHI·Filed 2008·Application pending·0 cites
- 1531US2008270056A1Wafer-level reliability yield enhancement system and related methodYANG YUN-CHI·Filed 2007·Application pending·0 cites
- 1622US8510635B2Method for evaluating failure rateYANG YUN-CHI·Filed 2010·Granted Aug 13, 2013·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →