Inventor · disambiguated record
Ta-Hone Yang
Also filed as: YANG TA-HONE
10 granted patents·6 pending applications·21 citations·filing 2010–2015
83Inventor score
Top patents by PatentIndex Score
16 records- 0188US9466610B1Method of fabricating three-dimensional gate-all-around vertical gate structures and semiconductor devices, and three-dimensional gate-all-round vertical gate structures and semiconductor devices thereofMACRONIX INT CO LTD·Filed 2015·Granted Oct 11, 2016·8 cites·23 claims
- 0282US9589086B2Method for measuring and analyzing surface structure of chip or waferMACRONIX INT CO LTD·Filed 2014·Granted Mar 7, 2017·5 cites·25 claims
- 0375US9006003B1Method of detecting bitmap failure associated with physical coordinateMACRONIX INT CO LTD·Filed 2014·Granted Apr 14, 2015·3 cites·19 claims
- 0469US9349746B1Method of fabricating deep trench semiconductor devices, and deep trench semiconductor devicesMACRONIX INT CO LTD·Filed 2015·Granted May 24, 2016·2 cites·26 claims
- 0565US9116108B1Electron beam inspection optimizationMACRONIX INT CO LTD·Filed 2014·Granted Aug 25, 2015·1 cites·16 claims
- 0664US9244112B2Method for detecting an electrical defect of contact/via plugsMACRONIX INT CO LTD·Filed 2014·Granted Jan 26, 2016·1 cites·22 claims
- 0755US8594963B2In-line inspection yield prediction systemLIAO HSIANG-CHOU·Filed 2010·Granted Nov 26, 2013·1 cites·18 claims
- 0845US9305794B2Etching method and etching compositionMACRONIX INT CO LTD·Filed 2014·Granted Apr 5, 2016·0 cites·13 claims
- 0943US9869712B2Method and system for detecting defects of wafer by wafer sortMACRONIX INT CO LTD·Filed 2015·Granted Jan 16, 2018·0 cites·27 claims
- 1043US2015110384A1Image inspection method of die to databaseMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 1142US2015357203A1Patterning method and patterning apparatusMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 1242US2016110859A1Inspection method for contact by die to databaseMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 1341US8669184B2Method for improving flatness of a layer deposited on polycrystalline layerLUOH TUUNG·Filed 2011·Granted Mar 11, 2014·0 cites·6 claims
- 1439US2016172294A1High aspect ratio structureMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 1531US2016204123A1Method of fabricating three-dimensional semiconductor devices, and three-dimensional semiconductor devices thereofMACRONIX INT CO LTD·Filed 2015·Application pending·0 cites
- 1631US2016358932A1Gate-all-around vertical gate memory structures and semiconductor devices, and methods of fabricating gate-all-around vertical gate memory structures and semiconductor devices thereofMACRONIX INT CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →