Inventor · disambiguated record
Masayoshi Tonouchi
Also filed as: TONOUCHI MASAYOSHI
17 granted patents·1 pending application·55 citations·filing 1988–2015
91Inventor score
Files withDAINIPPON SCREEN MFG5SCREEN HOLDINGS CO LTD5NAKANISHI HIDETOSHI3AISIN SEIKI2HAMAMATSU PHOTONICS KK1
Top patents by PatentIndex Score
18 records- 0189US9404874B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2015·Granted Aug 2, 2016·4 cites·12 claims
- 0287US9234934B2Inspecting device and inspecting methodDAINIPPON SCREEN MFG·Filed 2013·Granted Jan 12, 2016·7 cites·5 claims
- 0385US9541508B2Inspecting device and inspecting methodDAINIPPON SCREEN MFG·Filed 2014·Granted Jan 10, 2017·5 cites·7 claims
- 0482US9383321B2Inspection apparatus and inspection methodDAINIPPON SCREEN MFG·Filed 2014·Granted Jul 5, 2016·4 cites·5 claims
- 0582US8872114B2Inspection apparatus and inspection methodNAKANISHI HIDETOSHI·Filed 2012·Granted Oct 28, 2014·5 cites·17 claims
- 0676US9151669B2Inspecting device and inspecting methodDAINIPPON SCREEN MFG·Filed 2014·Granted Oct 6, 2015·3 cites·5 claims
- 0776US9103870B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2013·Granted Aug 11, 2015·3 cites·13 claims
- 0874US9651607B2Photo device inspection apparatus and photo device inspection methodDAINIPPON SCREEN MFG·Filed 2014·Granted May 16, 2017·2 cites·4 claims
- 0968US9450536B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2015·Granted Sep 20, 2016·1 cites·7 claims
- 1066US7173447B2Method and apparatus for diagnosing fault in semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Feb 6, 2007·6 cites·15 claims
- 1162US10158325B2Inspection apparatus and inspection methodSCREEN HOLDINGS CO LTD·Filed 2014·Granted Dec 18, 2018·1 cites·6 claims
- 1262US8941824B2Semiconductor inspection method and semiconductor inspection apparatusNAKANISHI HIDETOSHI·Filed 2012·Granted Jan 27, 2015·1 cites·6 claims
- 1358US6980010B2Method and apparatus for inspecting wire breaking of integrated circuitAISIN SEIKI·Filed 2004·Granted Dec 27, 2005·11 cites·2 claims
- 1451US8530868B2Electromagnetic radiation generating element, electromagnetic radiation generating device, and method of generating electromagnetic radiationNAKANISHI HIDETOSHI·Filed 2012·Granted Sep 10, 2013·0 cites·12 claims
- 1547US2011216312A1Semiconductor inspection device and inspection methodHAMAMATSU PHOTONICS KK·Filed 2009·Application pending·0 cites
- 1640US10001441B2Modification processing device, modification monitoring device and modification processing methodSCREEN HOLDINGS CO LTD·Filed 2015·Granted Jun 19, 2018·0 cites·7 claims
- 1734US7466151B2Electric-field distribution measurement method and apparatus for semiconductor deviceAISIN SEIKI·Filed 2004·Granted Dec 16, 2008·0 cites·14 claims
- 1833US4996191AMethod for etching superconductor materialsLION CORP·Filed 1988·Granted Feb 26, 1991·2 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →