Inventor · disambiguated record
Hideyuki Ohtake
Also filed as: OHTAKE HIDEYUKI
11 granted patents·5 pending applications·55 citations·filing 2002–2018
87Inventor score
Top patents by PatentIndex Score
16 records- 0185US8513608B2Coating film inspection apparatus and inspection methodOHTAKE HIDEYUKI·Filed 2011·Granted Aug 20, 2013·9 cites·4 claims
- 0279US7488940B2Reflection type terahertz spectrometer and spectrometric methodAISIN SEIKI·Filed 2004·Granted Feb 10, 2009·18 cites·18 claims
- 0375US7177071B2Semiconductor crystal for generating terahertz waves, terahertz wave-generator incorporating the crystal, semiconductor crystal for detecting terahertz waves, and terahertz waves detector incorporating the crystalAISIN SEIKI·Filed 2005·Granted Feb 13, 2007·7 cites·4 claims
- 0471US7593099B2Method and device for configuration examinationAISIN SEIKI·Filed 2007·Granted Sep 22, 2009·4 cites·6 claims
- 0569US9841272B2Film thickness measuring device and film thickness measuring methodTOYOTA MOTOR CO LTD·Filed 2015·Granted Dec 12, 2017·2 cites·9 claims
- 0665US7221451B2Multi-channeled measuring method and apparatus for measuring spectrum of terahertz pulseAISIN SEIKI·Filed 2004·Granted May 22, 2007·8 cites·9 claims
- 0757US8497490B2Terahertz wave generation device and method for generating terahertz waveOHTAKE HIDEYUKI·Filed 2009·Granted Jul 30, 2013·1 cites·10 claims
- 0847US8450689B2Device and method for measuring thickness of paint film in non-contacting mannerOHTAKE HIDEYUKI·Filed 2009·Granted May 28, 2013·1 cites·4 claims
- 0947US2010054296A1Terahertz wave generating apparatus and terahertz wave generating methodAISIN SEIKI·Filed 2009·Application pending·0 cites
- 1044US11289621B2Method for producing semiconductor light emitting elementNICHIA CORP·Filed 2018·Granted Mar 29, 2022·0 cites·19 claims
- 1141US2010195090A1Device for measuring thickness of paint film in non-contacting mannerAISIN SEIKI·Filed 2009·Application pending·0 cites
- 1240US7096384B2Fault simulator for verifying reliability of test patternMITSUBISHI ELEC SYS LSI DESIGN·Filed 2003·Granted Aug 22, 2006·5 cites·2 claims
- 1340US2006029110A1Cavity monitoring device for pulse laserIMRA AMERICA INC·Filed 2004·Application pending·0 cites
- 1440US2010195092A1Noncontact film thickness measurement method and deviceAISIN SEIKI·Filed 2008·Application pending·0 cites
- 1534US7466151B2Electric-field distribution measurement method and apparatus for semiconductor deviceAISIN SEIKI·Filed 2004·Granted Dec 16, 2008·0 cites·14 claims
- 1623US2003149916A1Fault verification apparatusFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →