Inventor · disambiguated record
Takayoshi Matsuyama
Also filed as: MATSUYAMA TAKAYOSHI
8 granted patents·1 pending application·137 citations·filing 1984–2019
87Inventor score
Top patents by PatentIndex Score
9 records- 0178US11029674B2Information processing device and information processing methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Jun 8, 2021·2 cites·17 claims
- 0273US4669123AInspecting method and apparatus for photomask patternFUJITSU LTD·Filed 1984·Granted May 26, 1987·29 cites·13 claims
- 0372US6064484APattern inspection method and systemFUJITSU LTD·Filed 1997·Granted May 16, 2000·40 cites·28 claims
- 0463US6603875B1Pattern inspection method, pattern inspection apparatus, and recording medium which records pattern inspection programFUJITSU LTD·Filed 2000·Granted Aug 5, 2003·11 cites·9 claims
- 0560US10639759B2Load state diagnosis device and load state diagnosis method for servomotorOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted May 5, 2020·0 cites·16 claims
- 0660US4701859AInspecting method and apparatus for a photomask patternFUJITSU LTD·Filed 1984·Granted Oct 20, 1987·22 cites·10 claims
- 0754US5900941AHigh speed pattern inspection method and systemFUJITSU LTD·Filed 1997·Granted May 4, 1999·21 cites·30 claims
- 0844US2021121623A1Controller, method for controlling controller, learning device, and storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2019·Application pending·0 cites
- 0939US6327379B2Pattern inspection method and apparatusFUJITSU LTD·Filed 1997·Granted Dec 4, 2001·12 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Takayoshi Matsuyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →