Inventor · disambiguated record
Warren Lin
Also filed as: LIN WARREN · LIN WARREN W
16 granted patents·2 pending applications·1,056 citations·filing 1988–2005
96Inventor score
Top patents by PatentIndex Score
18 records- 0196US6750974B2Method and system for 3D imaging of target regionsGSI LUMONICS CORP·Filed 2002·Granted Jun 15, 2004·101 cites·21 claims
- 0296US5872633AMethods and apparatus for detecting removal of thin film layers during planarizationSPEEDFAM CORP·Filed 1997·Granted Feb 16, 1999·390 cites·17 claims
- 0394US7219777B2Reinforced brake rotorLIN WARREN·Filed 2003·Granted May 22, 2007·42 cites·11 claims
- 0494US7199882B2Method and system for high speed measuring of microscopic targetsGSI GROUP CORP·Filed 2005·Granted Apr 3, 2007·25 cites·4 claims
- 0593US7097007B2Vented slot brake rotorLIN WARREN·Filed 2003·Granted Aug 29, 2006·36 cites·6 claims
- 0691US6249347B1Method and system for high speed measuring of microscopic targetsGEN SCANNING INC·Filed 1999·Granted Jun 19, 2001·58 cites·4 claims
- 0790US4826321AThin dielectric film measuring systemNANOMETRICS INC·Filed 1988·Granted May 2, 1989·60 cites·10 claims
- 0889US6177998B1Method and system for high speed measuring of microscopic targetsGEN SCANNING INC·Filed 1999·Granted Jan 23, 2001·46 cites·6 claims
- 0988US7568560B2Center mount two piece brake rotorLIN WARREN·Filed 2004·Granted Aug 4, 2009·25 cites·4 claims
- 1088US5733171AApparatus for the in-process detection of workpieces in a CMP environmentSPEEDFAM CORP·Filed 1996·Granted Mar 31, 1998·71 cites·16 claims
- 1187US6366357B1Method and system for high speed measuring of microscopic targetsGEN SCANNING INC·Filed 1998·Granted Apr 2, 2002·50 cites·16 claims
- 1286US5961369AMethods for the in-process detection of workpieces with a monochromatic light sourceSPEEDFAM IPEC CORP·Filed 1998·Granted Oct 5, 1999·61 cites·10 claims
- 1380US6181425B1Method and system for high speed measuring of microscopic targetsGEN SCANNING INC·Filed 1999·Granted Jan 30, 2001·29 cites·7 claims
- 1469US5823853AApparatus for the in-process detection of workpieces with a monochromatic light sourceSPEEDFAM CORP·Filed 1997·Granted Oct 20, 1998·36 cites·9 claims
- 1561US5993289AMethods for the in-process detection of workpieces in a CMP environmentSPEEDFAM IPEC CORP·Filed 1998·Granted Nov 30, 1999·19 cites·16 claims
- 1640US2004179207A1Method and system for high speed measuring of microscopic targetsGSI LUMONICS CORP·Filed 2004·Application pending·0 cites
- 1739US5164857AWide band non-coated beam splitterNANOMETRICS INC·Filed 1991·Granted Nov 17, 1992·7 cites·6 claims
- 1830US2001012108A1Methods and apparatus for the in-process measurement of thin film layersFiled 1998·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Warren Lin files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →