Inventor · disambiguated record
W. Jarrett Campbell
Also filed as: CAMPBELL W JARRETT
5 granted patents·139 citations·filing 1999–2001
83Inventor score
Top patents by PatentIndex Score
5 records- 0182US6629012B1Wafer-less qualification of a processing toolADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 30, 2003·29 cites·34 claims
- 0282US6276989B1Method and apparatus for controlling within-wafer uniformity in chemical mechanical polishingADVANCED MICRO DEVICES INC·Filed 1999·Granted Aug 21, 2001·56 cites·28 claims
- 0377US6718224B2System and method for estimating error in a manufacturing processYIELD DYNAMICS INC·Filed 2001·Granted Apr 6, 2004·28 cites·23 claims
- 0474US6643596B2System and method for controlling critical dimension in a semiconductor manufacturing processYIELD DYNAMICS INC·Filed 2001·Granted Nov 4, 2003·18 cites·22 claims
- 0542US6348289B1System and method for controlling polysilicon feature critical dimension during processingADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 19, 2002·8 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →