Inventor · disambiguated record
Dale M. Brown
Also filed as: BROWN DALE M · BROWN DALE MARIUS
58 granted patents·5 pending applications·2,549 citations·filing 1975–2013
99Inventor score
Top patents by PatentIndex Score
63 records- 0199US5544478AOptical sensing of combustion dynamicsGEN ELECTRIC·Filed 1994·Granted Aug 13, 1996·144 cites·20 claims
- 0298US5257496ACombustion control for producing low NOx emissions through use of flame spectroscopyGEN ELECTRIC·Filed 1992·Granted Nov 2, 1993·114 cites·50 claims
- 0397US5726463ASilicon carbide MOSFET having self-aligned gate structureGEN ELECTRIC·Filed 1992·Granted Mar 10, 1998·144 cites·5 claims
- 0494US5487266ACombustion control for producing low NOx emissions through use of flame spectroscopyGEN ELECTRIC·Filed 1994·Granted Jan 30, 1996·81 cites·22 claims
- 0594US5394005ASilicon carbide photodiode with improved short wavelength response and very low leakage currentGEN ELECTRIC·Filed 1994·Granted Feb 28, 1995·138 cites·20 claims
- 0694US4895780AAdjustable windage method and mask for correction of proximity effect in submicron photolithographyGEN ELECTRIC·Filed 1988·Granted Jan 23, 1990·105 cites·11 claims
- 0794US4361600AMethod of making integrated circuitsGEN ELECTRIC·Filed 1981·Granted Nov 30, 1982·109 cites·19 claims
- 0893US5059800ATwo dimensional mosaic scintillation detectorGEN ELECTRIC·Filed 1991·Granted Oct 22, 1991·74 cites·20 claims
- 0992US5303684ACombustion control for producing low NOx emissions through use of flame spectroscopyGEN ELECTRIC·Filed 1993·Granted Apr 19, 1994·61 cites·16 claims
- 1092US4412868AMethod of making integrated circuits utilizing ion implantation and selective epitaxial growthGEN ELECTRIC·Filed 1981·Granted Nov 1, 1983·100 cites·5 claims
- 1191US5480298ACombustion control for producing low NOx emissions through use of flame spectroscopyGEN ELECTRIC·Filed 1994·Granted Jan 2, 1996·69 cites·13 claims
- 1291US5385855AFabrication of silicon carbide integrated circuitsGEN ELECTRIC·Filed 1994·Granted Jan 31, 1995·113 cites·12 claims
- 1388US5514604AVertical channel silicon carbide metal-oxide-semiconductor field effect transistor with self-aligned gate for microwave and power applications, and method of makingGEN ELECTRIC·Filed 1995·Granted May 7, 1996·78 cites·16 claims
- 1488US4227098ASolid state relayGEN ELECTRIC·Filed 1979·Granted Oct 7, 1980·69 cites·9 claims
- 1586US6838741B2Avalanche photodiode for use in harsh environmentsGEN ELECTTRIC COMPANY·Filed 2002·Granted Jan 4, 2005·45 cites·38 claims
- 1686US5467185AEmissions control for internal combustion engineGEN ELECTRIC·Filed 1994·Granted Nov 14, 1995·39 cites·26 claims
- 1786US4638400ARefractory metal capacitor structures, particularly for analog integrated circuit devicesGEN ELECTRIC·Filed 1985·Granted Jan 20, 1987·51 cites·19 claims
- 1884US5672889AVertical channel silicon carbide metal-oxide-semiconductor field effect transistor with self-aligned gate for microwave and power applications, and method of makingGEN ELECTRIC·Filed 1996·Granted Sep 30, 1997·59 cites·4 claims
- 1984US5378642AMethod of making a silicon carbide junction field effect transistor device for high temperature applicationsGEN ELECTRIC·Filed 1993·Granted Jan 3, 1995·48 cites·9 claims
- 2083US6350988B1Optical spectrometer and method for combustion flame temperature determinationGEN ELECTRIC·Filed 2000·Granted Feb 26, 2002·27 cites·14 claims
- 2182US6768326B2SiC photodiode detectors for radiation detection applicationsGEN ELECTRIC·Filed 2001·Granted Jul 27, 2004·24 cites·23 claims
- 2282US5057682AQuiescent signal compensated photodetector system for large dynamic range and high linearityGEN ELECTRIC·Filed 1990·Granted Oct 15, 1991·59 cites·30 claims
- 2380US4268843ASolid state relayGEN ELECTRIC·Filed 1980·Granted May 19, 1981·43 cites·11 claims
- 2479US5578828AFlame sensor window coating compensationGEN ELECTRIC·Filed 1994·Granted Nov 26, 1996·44 cites·19 claims
- 2578US5978525AFiber optic sensors for gas turbine controlGEN ELECTRIC·Filed 1997·Granted Nov 2, 1999·46 cites·12 claims
- 2678US4677736ASelf-aligned inlay transistor with or without source and drain self-aligned metallization extensionsGEN ELECTRIC·Filed 1986·Granted Jul 7, 1987·50 cites·31 claims
- 2777US4737828AMethod for gate electrode fabrication and symmetrical and non-symmetrical self-aligned inlay transistors made therefromGEN ELECTRIC·Filed 1986·Granted Apr 12, 1988·32 cites·28 claims
- 2876US4228212AComposite conductive structures in integrated circuitsGEN ELECTRIC·Filed 1979·Granted Oct 14, 1980·19 cites·11 claims
- 2975US7112796B2System and method for optical monitoring of a combustion flameGEN ELECTRIC·Filed 2003·Granted Sep 26, 2006·16 cites·26 claims
- 3075US6784430B2Interdigitated flame sensor, system and methodGEN ELECTRIC·Filed 2002·Granted Aug 31, 2004·18 cites·18 claims
- 3175US4824802AMethod of filling interlevel dielectric via or contact holes in multilevel VLSI metallization structuresGEN ELECTRIC·Filed 1987·Granted Apr 25, 1989·42 cites·8 claims
- 3274US7002156B2Detection system including avalanche photodiode for use in harsh environmentsGEN ELECTRIC·Filed 2004·Granted Feb 21, 2006·16 cites·27 claims
- 3374US5608515ADouble window for protecting optical sensors from hazardous environmentsGEN ELECTRIC·Filed 1995·Granted Mar 4, 1997·48 cites·15 claims
- 3474US4845050AMethod of making mo/tiw or w/tiw ohmic contacts to siliconGEN ELECTRIC·Filed 1987·Granted Jul 4, 1989·43 cites·11 claims
- 3573US6818897B2Photodiode device and method for fabricationGEN ELECTRIC·Filed 2003·Granted Nov 16, 2004·11 cites·6 claims
- 3673US5510632ASilicon carbide junction field effect transistor device for high temperature applicationsGEN ELECTRIC·Filed 1995·Granted Apr 23, 1996·29 cites·3 claims
- 3771US4263058AComposite conductive structures in integrated circuits and method of making sameGEN ELECTRIC·Filed 1980·Granted Apr 21, 1981·23 cites·5 claims
- 3869US6646265B2Optical spectrometer and method for combustion flame temperature determinationGEN ELECTRIC·Filed 2001·Granted Nov 11, 2003·9 cites·13 claims
- 3967US6239434B1Solid state optical spectrometer for combustion flame temperature measurementGEN ELECTRIC·Filed 1999·Granted May 29, 2001·31 cites·21 claims
- 4067US5589682APhotocurrent detector circuit with high sensitivity, fast response time, and large dynamic rangeGEN ELECTRIC·Filed 1995·Granted Dec 31, 1996·33 cites·11 claims
- 4165US4227944AMethods of making composite conductive structures in integrated circuitsGEN ELECTRIC·Filed 1979·Granted Oct 14, 1980·21 cites·16 claims
- 4263US8377812B2SiC MOSFETs and self-aligned fabrication methods thereofGEN ELECTRIC·Filed 2009·Granted Feb 19, 2013·1 cites·22 claims
- 4363US4012767AElectrical interconnections for semi-conductor devicesGEN ELECTRIC·Filed 1976·Granted Mar 15, 1977·20 cites·12 claims
- 4461US5035964APassive cooling device for extending battery lifeGEN ELECTRIC·Filed 1989·Granted Jul 30, 1991·20 cites·20 claims
- 4560US5963791ASilicon carbide MOSFET having self-aligned gate structure and method of fabricationGEN ELECTRIC·Filed 1997·Granted Oct 5, 1999·17 cites·6 claims
- 4659US4536782AField effect semiconductor devices and method of making sameGEN ELECTRIC·Filed 1983·Granted Aug 20, 1985·21 cites·8 claims
- 4755US5187380ALow capacitance X-ray radiation detectorGEN ELECTRIC·Filed 1992·Granted Feb 16, 1993·18 cites·24 claims
- 4855US4024562ARadiation sensing and charge storage devicesGEN ELECTRIC·Filed 1976·Granted May 17, 1977·17 cites·1 claims
- 4952US4146904ARadiation detectorGEN ELECTRIC·Filed 1977·Granted Mar 27, 1979·14 cites·9 claims
- 5052US3988613ARadiation sensing and charge storage devicesGEN ELECTRIC·Filed 1975·Granted Oct 26, 1976·15 cites·11 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →