Inventor · disambiguated record
Hiroyuki Ohde
Also filed as: OHDE HIROYUKI
11 granted patents·1 pending application·116 citations·filing 1994–2014
88Inventor score
Top patents by PatentIndex Score
12 records- 0194US6653236B2Methods of forming metal-containing films over surfaces of semiconductor substrates; and semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 25, 2003·83 cites·73 claims
- 0273US7582561B2Method of selectively depositing materials on a substrate using a supercritical fluidMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 1, 2009·5 cites·33 claims
- 0372US7400043B2Semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 15, 2008·3 cites·6 claims
- 0471US8241708B2Formation of insulator oxide films with acid or base catalyzed hydrolysis of alkoxides in supercritical carbon dioxideWAI CHIEN M·Filed 2005·Granted Aug 14, 2012·3 cites·60 claims
- 0564US7897517B2Method of selectively depositing materials on a substrate using a supercritical fluidMICRON TECHNOLOGY INC·Filed 2009·Granted Mar 1, 2011·2 cites·35 claims
- 0661US9676944B2Methods of increasing the solubility of materials in supercritical carbon dioxideMICRON TECHNOLOGY INC·Filed 2014·Granted Jun 13, 2017·0 cites·20 claims
- 0753US8912238B2Compositions comprising supercritical carbon dioxide and metallic compoundsWAI CHIEN M·Filed 2012·Granted Dec 16, 2014·0 cites·9 claims
- 0853US7341947B2Methods of forming metal-containing films over surfaces of semiconductor substratesMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 11, 2008·3 cites·55 claims
- 0947US7423345B2Semiconductor constructions comprising a layer of metal over a substrateMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 9, 2008·1 cites·19 claims
- 1040US2006160367A1Methods of treating semiconductor substratesMICRON TECHNOLOGY INC AND IDAH·Filed 2005·Application pending·0 cites
- 1137US5629939ATime slot rearranging apparatus in multiplexerFUJITSU LTD·Filed 1994·Granted May 13, 1997·10 cites·8 claims
- 1231US5448388AOptical subscriber line systemFUJITSU LTD·Filed 1994·Granted Sep 5, 1995·6 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →