Inventor · disambiguated record
Shouzou Hirano
Also filed as: HIRANO SHOUZOU
7 granted patents·3 pending applications·110 citations·filing 2000–2005
86Inventor score
Top patents by PatentIndex Score
10 records- 0181US7480875B2Method of designing a semiconductor integrated circuitPANASONIC CORP·Filed 2005·Granted Jan 20, 2009·12 cites·6 claims
- 0279US7225418B2Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted May 29, 2007·25 cites·38 claims
- 0373US6782347B2Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Aug 24, 2004·20 cites·27 claims
- 0472US6810340B2Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Oct 26, 2004·19 cites·58 claims
- 0568US6876210B2Method and apparatus for analyzing electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Apr 5, 2005·14 cites·28 claims
- 0662US6754598B2Electromagnetic interference analysis method and apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jun 22, 2004·10 cites·50 claims
- 0761US6959250B1Method of analyzing electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Oct 25, 2005·10 cites·11 claims
- 0844US2005005254A1Substrate noise analyzing method for semiconductor integrated circuit, semiconductor integrated circuit, and substrate noise analyzing device for semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 0943US2006091550A1Method of analyzing operation of semiconductor integrated circuit device, analyzing apparatus used in the same, and optimization designing method using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 1033US2002045995A1Electromagnetic interference analysis method and apparatusFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →