Inventor · disambiguated record

Masayuki Yojima

Also filed as: YOJIMA MASAYUKI

2 granted patents·208 citations·filing 1993–1996

71Inventor score

Technology areasG01B G01R

Files withNEC CORP2

Top patents by PatentIndex Score

2 records

0192US5392110AMethod and device for measuring height of object whose surface has irregular reflectanceNEC CORP·Filed 1993·Granted Feb 21, 1995·108 cites·6 claims
0290US6133744AApparatus for testing semiconductor waferNEC CORP·Filed 1996·Granted Oct 17, 2000·100 cites·9 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →