Inventor · disambiguated record
Deepak Ranjan Sahoo
Also filed as: SAHOO DEEPAK R · SAHOO DEEPAK RANJAN
13 granted patents·69 citations·filing 2004–2022
90Inventor score
Top patents by PatentIndex Score
13 records- 0194US11228838B2Acoustic wave manipulation by means of a time delay arrayUNIV SUSSEX·Filed 2020·Granted Jan 18, 2022·6 cites·20 claims
- 0294US10873812B2Acoustic wave manipulation by means of a time delay arrayUNIV SUSSEX·Filed 2018·Granted Dec 22, 2020·13 cites·48 claims
- 0392US11785384B2Acoustic wave manipulationUNIV SUSSEX·Filed 2022·Granted Oct 10, 2023·3 cites·20 claims
- 0483US8026715B2Magneto-resistance based nano-scale position sensorIBM·Filed 2008·Granted Sep 27, 2011·9 cites·19 claims
- 0580US7627438B1Observer based Q-control imaging methods for atomic force microscopyUNIV IOWA STATE RES FOUND INC·Filed 2007·Granted Dec 1, 2009·8 cites·13 claims
- 0669US7313948B2Real time detection of loss of cantilever sensing lossUNIV IOWA STATE RES FOUND·Filed 2006·Granted Jan 1, 2008·4 cites·19 claims
- 0767US8484760B2Device comprising a cantilever and scanning systemDESPONT MICHAEL·Filed 2010·Granted Jul 9, 2013·3 cites·14 claims
- 0867US7360405B2Method to transiently detect sample features using cantileversUNIV IOWA STATE RES FOUND INC·Filed 2006·Granted Apr 22, 2008·4 cites·19 claims
- 0965US8819860B2Device comprising a cantilever and scanning systemIBM·Filed 2013·Granted Aug 26, 2014·1 cites·14 claims
- 1065US7066014B2Method to transiently detect samples in atomic force microscopesUNIV IOWA STATE RES FOUND INC·Filed 2004·Granted Jun 27, 2006·14 cites·19 claims
- 1161US8689358B2Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantileversKARTIK VENKATARAMAN·Filed 2010·Granted Apr 1, 2014·2 cites·21 claims
- 1246US8395877B2High-speed electrostatic actuation of MEMS-based devicesPOZIDIS CHARALAMPOS·Filed 2009·Granted Mar 12, 2013·2 cites·21 claims
- 1344US8026719B2Magneto-resistance based topography sensingIBM·Filed 2008·Granted Sep 27, 2011·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →