Inventor · disambiguated record
Yohsuke Itagaki
Also filed as: ITAGAKI YOHSUKE
4 granted patents·17 citations·filing 2002–2008
74Inventor score
Technology areasH10P
Top patents by PatentIndex Score
4 records- 0170US7795593B2Surface contamination analyzer for semiconductor wafersTOPCON CORP·Filed 2008·Granted Sep 14, 2010·2 cites·18 claims
- 0270US7700380B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceTOPCON CORP·Filed 2005·Granted Apr 20, 2010·2 cites·13 claims
- 0368US6943043B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Sep 13, 2005·8 cites·21 claims
- 0459US6753194B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Jun 22, 2004·5 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →