Inventor · disambiguated record
Tassanee Payakapan
Also filed as: PAYAKAPAN TASSANEE
5 granted patents·1 pending application·112 citations·filing 2004–2022
79Inventor score
Top patents by PatentIndex Score
6 records- 0195US7302625B1Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfigurationXILINX INC·Filed 2005·Granted Nov 27, 2007·79 cites·12 claims
- 0291US7761755B1Circuit for and method of testing for faults in a programmable logic deviceXILINX INC·Filed 2007·Granted Jul 20, 2010·25 cites·20 claims
- 0371US7725787B1Testing of a programmable deviceXILINX INC·Filed 2008·Granted May 25, 2010·5 cites·20 claims
- 0455US12487282B2On-chip distribution of test data for multiple diesADVANCED MICRO DEVICES PRODUCTS CHINA CO LTD·Filed 2021·Granted Dec 2, 2025·0 cites·20 claims
- 0547US7454675B1Testing of a programmable deviceXILINX INC·Filed 2004·Granted Nov 18, 2008·3 cites·16 claims
- 0644US2024037312A1Selective scan insertion for rapid scan design verificationATI TECHNOLOGIES ULC·Filed 2022·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Tassanee Payakapan files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →