Inventor · disambiguated record
Hun-Dae Choi
Also filed as: CHOI HUN · CHOI HUN-DAE
29 granted patents·1 pending application·109 citations·filing 2010–2022
95Inventor score
Top patents by PatentIndex Score
30 records- 0192US9998121B2Output buffer circuit and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 12, 2018·9 cites·20 claims
- 0290US10276220B2ZQ calibration method of memory device with shared ZQ pin and memory device performing the ZQ calibration methodSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 30, 2019·11 cites·16 claims
- 0389US10530371B2Delay locked loop to cancel offset and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jan 7, 2020·8 cites·6 claims
- 0487US9088287B2Divided clock generation device and divided clock generation methodSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jul 21, 2015·8 cites·20 claims
- 0585US10354704B2Semiconductor memory device and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jul 16, 2019·7 cites·20 claims
- 0685US10069495B2Semiconductor memory device for calibrating a termination resistance and a method of calibrating the termination resistance thereofSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Sep 4, 2018·8 cites·20 claims
- 0784US10141931B2Memory device, memory system including the same, and slew rate calibration method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Nov 27, 2018·4 cites·20 claims
- 0884US9389953B2Semiconductor memory device and system conducting parity check and operating method of semiconductor memory deviceCHOI HUN-DAE·Filed 2014·Granted Jul 12, 2016·14 cites·27 claims
- 0981US10320398B2Delay locked loop to cancel offset and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 11, 2019·5 cites·14 claims
- 1081US9590628B2Reference voltage training device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Mar 7, 2017·6 cites·20 claims
- 1179US9847113B2Delay-locked loop circuit and semiconductor memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 19, 2017·5 cites·9 claims
- 1277US11651813B2Clock correction circuit and memory system comprising the clock correction circuitSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 16, 2023·1 cites·20 claims
- 1376US9978460B2Memory module including on-die termination circuit and control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted May 22, 2018·4 cites·17 claims
- 1475US11342011B2Semiconductor memory device and operating method of semiconductor memory device to reduce duty errorsSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted May 24, 2022·1 cites·18 claims
- 1574US10748585B2Calibration circuit including common node shared by pull-up calibration path and pull-down calibration path, and semiconductor memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Aug 18, 2020·3 cites·20 claims
- 1672US10600458B2Memory device and method of operating the same for latency controlSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 24, 2020·3 cites·20 claims
- 1772US10389357B2Level shifter and display device including the sameSILICON WORKS CO LTD·Filed 2015·Granted Aug 20, 2019·2 cites·11 claims
- 1869US8143917B2Transceiver for controlling swing width of output voltageJANG YOUNG-CHAN·Filed 2010·Granted Mar 27, 2012·3 cites·16 claims
- 1965US10014043B2Memory device having command window generatorSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 3, 2018·2 cites·20 claims
- 2060US10727826B2Delay-locked loop circuit, semiconductor memory device, and methods of operating delay-locked loop circuitSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 28, 2020·2 cites·20 claims
- 2159US8345492B2Memory controller for detecting read latency, memory system and test system having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Jan 1, 2013·2 cites·19 claims
- 2258US10878869B2Memory device including common mode extractorSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 29, 2020·1 cites·20 claims
- 2347US11888489B2Delay locked loop including replica fine delay circuit and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jan 30, 2024·0 cites·20 claims
- 2445US10861516B2Semiconductor memory device and operating method of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 8, 2020·0 cites·20 claims
- 2543US10283176B2Delay-locked loop circuit and semiconductor memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 7, 2019·0 cites·9 claims
- 2641US10367490B2Electronic circuits for outputting post emphasis signalsSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jul 30, 2019·0 cites·20 claims
- 2740US10491223B2Memory device including a delay locked loop and operating method of the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 26, 2019·0 cites·18 claims
- 2837US10923181B2Semiconductor memory device and memory system having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 16, 2021·0 cites·20 claims
- 2937US2014181567A1Command control circuit for memory device and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 3025US9830972B2Semiconductor device and semiconductor systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Nov 28, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →