Inventor · disambiguated record
Wen-Li Wu
Also filed as: WU WEN-LI
15 granted patents·4 pending applications·197 citations·filing 1977–2025
92Inventor score
Files withIND TECH RES INST10MONSANTO CO4CALIFORNIA INST OF TECHN1GOVERNMENT OF THE US SECRETARY OF COMMERCE1SUN JIRUN1
Top patents by PatentIndex Score
19 records- 0196US10151713B2X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereofIND TECH RES INST·Filed 2016·Granted Dec 11, 2018·38 cites·18 claims
- 0296US4228118AProcess for producing high tenacity polyethylene fibersMONSANTO CO·Filed 1977·Granted Oct 14, 1980·78 cites·15 claims
- 0394US11867595B2X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrateIND TECH RES INST·Filed 2021·Granted Jan 9, 2024·4 cites·16 claims
- 0494US11579099B2X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrateIND TECH RES INST·Filed 2020·Granted Feb 14, 2023·4 cites·17 claims
- 0591US4276348AHigh tenacity polyethylene fibers and process for producing sameMONSANTO CO·Filed 1980·Granted Jun 30, 1981·41 cites·6 claims
- 0677US9390888B2Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrateIND TECH RES INST·Filed 2015·Granted Jul 12, 2016·3 cites·21 claims
- 0776US9297772B2Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurementsIND TECH RES INST·Filed 2014·Granted Mar 29, 2016·2 cites·12 claims
- 0871US12188883B2X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrateIND TECH RES INST·Filed 2022·Granted Jan 7, 2025·0 cites·28 claims
- 0966US2025334528A1X-ray apparatus for analyzing three-dimensional nanostructures and method for analyzing three-dimensional nanostructuresIND TECH RES INST·Filed 2024·Application pending·0 cites
- 1062US9847242B2Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurementsIND TECH RES INST·Filed 2014·Granted Dec 19, 2017·1 cites·11 claims
- 1159US10424458B2Electron reflectometer and process for performing shape metrologyGOVERNMENT OF THE US SECRETARY OF COMMERCE·Filed 2018·Granted Sep 24, 2019·1 cites·17 claims
- 1255US4244907ASpin-texture processMONSANTO CO·Filed 1979·Granted Jan 13, 1981·7 cites·5 claims
- 1355US2025334400A1Slit-adjustable substrate assisted x-ray leakage method for ultrathin film thickness detection device and measurement method using the sameIND TECH RES INST·Filed 2025·Application pending·0 cites
- 1453US2022273732A1Probiotic therapies for social deficit and stress responseCALIFORNIA INST OF TECHN·Filed 2022·Application pending·0 cites
- 1551US11287253B2Device and method applicable for measuring ultrathin thickness of film on substrateIND TECH RES INST·Filed 2019·Granted Mar 29, 2022·0 cites·20 claims
- 1649US4972720AThermal technique for determining interface and/or interply strength in compositesUS COMMERCE·Filed 1989·Granted Nov 27, 1990·12 cites·19 claims
- 1745US2012172485A1Dental compositions with titanium dioxide nanoparticlesSUN JIRUN·Filed 2012·Application pending·0 cites
- 1840US4132757ATwist efficiency of oxadiazole/hydrazide yarnMONSANTO CO·Filed 1977·Granted Jan 2, 1979·6 cites·10 claims
- 1923US8436996B2Apparatus and method for enhancing the electromagnetic signal of a sampleWU WEN-LI·Filed 2010·Granted May 7, 2013·0 cites·24 claims
Join the waitlist — get patent alerts
Get an alert when Wen-Li Wu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →