Inventor · disambiguated record
Erik René Kieft
Also filed as: KIEFT ERIK · KIEFT ERIK RENE · KIEFT ERIK RENÉ
17 granted patents·7 pending applications·48 citations·filing 2003–2025
91Inventor score
Top patents by PatentIndex Score
24 records- 0194US11127562B1System and method for RF pulsed electron beam based STEMFEI CO·Filed 2020·Granted Sep 21, 2021·3 cites·20 claims
- 0288US11328892B2Coating on dielectric insert of a resonant RF cavityFEI CO·Filed 2020·Granted May 10, 2022·4 cites·13 claims
- 0385US9984852B1Time-of-flight charged particle spectroscopyFEI CO·Filed 2016·Granted May 29, 2018·7 cites·20 claims
- 0483US10032599B2Time-resolved charged particle microscopyFEI CO·Filed 2016·Granted Jul 24, 2018·3 cites·18 claims
- 0583US9048060B2Beam pulsing device for use in charged-particle microscopyFEI CO·Filed 2013·Granted Jun 2, 2015·10 cites·20 claims
- 0678US2025349505A1Temporal characterization of oscillator signals in charged particle microscopyFEI CO·Filed 2025·Application pending·0 cites
- 0778US2025349492A1Beam synchronization in microscopyFEI CO·Filed 2025·Application pending·0 cites
- 0877US11282670B1Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample imagesFEI CO·Filed 2020·Granted Mar 22, 2022·1 cites·20 claims
- 0974US11961709B2Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2022·Granted Apr 16, 2024·0 cites·20 claims
- 1074US10971326B2Multi-electron-beam imaging apparatus with improved performanceFEI CO·Filed 2019·Granted Apr 6, 2021·1 cites·12 claims
- 1172US10039518B2ROI paintingKONINKLIJKE PHILIPS NV·Filed 2013·Granted Aug 7, 2018·3 cites·12 claims
- 1271US10825648B2Studying dynamic specimens in a transmission charged particle microscopeFEI Comapny·Filed 2019·Granted Nov 3, 2020·3 cites·20 claims
- 1366US9724052B2Doctor aware automatic collimationKONINKLIJKE PHILIPS NV·Filed 2013·Granted Aug 8, 2017·3 cites·17 claims
- 1465US11551906B1Time-gated detection, dual-layer SPAD-based electron detectionFEI CO·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 1565US2025104958A1Blanker-enhanced moire imagingFEI CO·Filed 2023·Application pending·0 cites
- 1664US2025349491A1Beam alignment and synchronization in microscopyFEI CO·Filed 2024·Application pending·0 cites
- 1764US2025349503A1Beam alignment and synchronization in microscopyFEI CO·Filed 2024·Application pending·0 cites
- 1863US7528395B2Radiation source, lithographic apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2003·Granted May 5, 2009·10 cites·42 claims
- 1960US2020273667A1Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2020·Application pending·0 cites
- 2053US11114272B2Pulsed CFE electron source with fast blanker for ultrafast TEM applicationsFEI CO·Filed 2019·Granted Sep 7, 2021·0 cites·20 claims
- 2150US2004227102A1Method and device for measuring contamination of a surface of a component of a lithographic apparatusASML NETHERLANDS BV·Filed 2004·Application pending·0 cites
- 2243US11116940B2X-ray imaging system for a catheterKONINKLIJKE PHILIPS NV·Filed 2013·Granted Sep 14, 2021·0 cites·24 claims
- 2337US10340113B2Studying dynamic specimen behavior in a charged-particle microscopeFEI CO·Filed 2016·Granted Jul 2, 2019·0 cites·20 claims
- 2436US8446502B2Time domain multiplexing for imaging using time delay and integration sensorsKIEFT ERIK RENE·Filed 2010·Granted May 21, 2013·0 cites·15 claims
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