Inventor · disambiguated record
Xiankun Jin
Also filed as: JIN XIANKUN
16 granted patents·1 pending application·80 citations·filing 2015–2023
91Inventor score
Top patents by PatentIndex Score
17 records- 0197US11489535B1Analog-to-digital converter (ADC) testingNXP BV·Filed 2021·Granted Nov 1, 2022·10 cites·22 claims
- 0296US10505519B1Dynamic comparatorNXP USA INC·Filed 2019·Granted Dec 10, 2019·18 cites·20 claims
- 0396US9319033B1Ramp voltage generator and method for testing an analog-to-digital converterFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Apr 19, 2016·21 cites·19 claims
- 0489US11728336B2Compensated alternating polarity capacitive structuresNXP USA INC·Filed 2020·Granted Aug 15, 2023·2 cites·10 claims
- 0588US9473164B1Method for testing analog-to-digital converter and system thereforFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Oct 18, 2016·9 cites·19 claims
- 0687US11418188B1Bootstrapped switchNXP BV·Filed 2021·Granted Aug 16, 2022·3 cites·20 claims
- 0784US10345841B1Current source with variable resistor circuitNXP USA INC·Filed 2018·Granted Jul 9, 2019·4 cites·19 claims
- 0883US11585849B2Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereofNXP USA INC·Filed 2019·Granted Feb 21, 2023·2 cites·20 claims
- 0983US10770457B2Compensated alternating polarity capacitive structuresNXP USA INC·Filed 2018·Granted Sep 8, 2020·3 cites·10 claims
- 1083US10359469B2Non-intrusive on-chip analog test/trim/calibrate subsystemNXP USA INC·Filed 2017·Granted Jul 23, 2019·2 cites·20 claims
- 1183US9438262B1Method for testing differential analog-to-digital converter and system thereforFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Sep 6, 2016·4 cites·20 claims
- 1279US11561255B2Systems and methods for detecting faults in an analog input/output circuitryNXP USA INC·Filed 2021·Granted Jan 24, 2023·1 cites·15 claims
- 1375US10866277B2Analog-test-bus apparatuses involving calibration of comparator circuits and methods thereofNXP BV·Filed 2018·Granted Dec 15, 2020·1 cites·20 claims
- 1452US10816595B2Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereofNXP USA INC·Filed 2018·Granted Oct 27, 2020·0 cites·18 claims
- 1551US11961577B2Testing of on-chip analog-mixed signal circuits using on-chip memoryNXP USA INC·Filed 2022·Granted Apr 16, 2024·0 cites·20 claims
- 1647US10474553B2Built-in self test for A/D converterNXP USA INC·Filed 2017·Granted Nov 12, 2019·0 cites·17 claims
- 1745US2024020186A1Layered architecture for managing health of an electronic system and methods for layered health managementNXP BV·Filed 2023·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Xiankun Jin files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →