Inventor · disambiguated record
Jiunn-Der Yang
Also filed as: YANG JIUNN-DER
5 granted patents·152 citations·filing 1998–2002
83Inventor score
Files withTAIWAN SEMICONDUCTOR MFG5
Top patents by PatentIndex Score
5 records- 0186US6017771AMethod and system for yield loss analysis by yield management systemTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jan 25, 2000·80 cites·6 claims
- 0275US6211083B1Use of a novel capped anneal procedure to improve salicide formationTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Apr 3, 2001·26 cites·18 claims
- 0370US6727155B1Method for spin etching sidewall spacers by acid vaporTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 27, 2004·17 cites·18 claims
- 0463US6389323B1Method and system for yield loss analysis by yield management systemTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted May 14, 2002·26 cites·6 claims
- 0530US6373576B1Method for measuring concentrations of dopants in a liquid carrier on a wafer surfaceTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Apr 16, 2002·3 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →