Inventor · disambiguated record
Hendrik Richter
Also filed as: RICHTER HENDRIK
5 granted patents·5 pending applications·6 citations·filing 2006–2022
67Inventor score
Files withTEWS ELEKTRONIK GMBH & CO KG5HERRMANN RAINER1LIEBHERR WERK BISCHOFSHOFEN GMBH1LOOS CHRISTIAN1TEWS ELECTRONIK GMBH & CO KG1
Top patents by PatentIndex Score
10 records- 0169US9377417B2Method and device for measuring a moisture value of dielectric materialsHERRMANN RAINER·Filed 2008·Granted Jun 28, 2016·3 cites·26 claims
- 0265US12011986B2Work machineLIEBHERR WERK BISCHOFSHOFEN GMBH·Filed 2022·Granted Jun 18, 2024·0 cites·10 claims
- 0361US8354849B2Method and device for humidity and/or density measurementTEWS ELEKTRONIK GMBH & CO KG·Filed 2008·Granted Jan 15, 2013·2 cites·28 claims
- 0461US7793664B2Apparatus and method for detection and segregation of faulty cigarettesTEWS ELEKTRONIK DIPL ING MANFR·Filed 2006·Granted Sep 14, 2010·1 cites·21 claims
- 0558US12429433B2Method for measuring substance quantities in a mixtureTEWS ELEKTRONIK GMBH & CO KG·Filed 2021·Granted Sep 30, 2025·0 cites·10 claims
- 0652US2024206525A1Method for determining an additive content in a tobacco paper for electric cigarettesTEWS ELECTRONIK GMBH & CO KG·Filed 2022·Application pending·0 cites
- 0750US2025020494A1Method for calibrating a measuring apparatusTEWS ELEKTRONIK GMBH & CO KG·Filed 2021·Application pending·0 cites
- 0848US2022125095A1Method for processing at least two starting materialsTEWS ELEKTRONIK GMBH & CO KG·Filed 2019·Application pending·0 cites
- 0948US2023175944A1Method for determining at least one characteristic variable of a particle size distribution and a device comprising a measuring apparatusTEWS ELEKTRONIK GMBH & CO KG·Filed 2020·Application pending·0 cites
- 1026US2014006570A1Method and system for customer specific test system allocation in a production environmentLOOS CHRISTIAN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →