Inventor · disambiguated record
Jay Jianhui Chen
Also filed as: CHEN JAY · CHEN JAY JIANHUI
6 granted patents·23 citations·filing 2008–2019
78Inventor score
Top patents by PatentIndex Score
6 records- 0194US9903823B2Metrology method and apparatusASML NETHERLANDS BV·Filed 2015·Granted Feb 27, 2018·10 cites·20 claims
- 0282US10551750B2Metrology method and apparatus and associated computer productASML NETHERLANDS BV·Filed 2019·Granted Feb 4, 2020·2 cites·20 claims
- 0380US11281113B2Method for determining stack configuration of substrateASML NETHERLANDS BV·Filed 2019·Granted Mar 22, 2022·3 cites·20 claims
- 0478US8094428B2Wafer grounding methodologyWANG YI XIANG·Filed 2008·Granted Jan 10, 2012·7 cites·17 claims
- 0577US10310388B2Metrology method and apparatus and associated computer productASML NETHERLANDS BV·Filed 2018·Granted Jun 4, 2019·1 cites·20 claims
- 0643US10983440B2Selection of substrate measurement recipesASML NETHERLANDS BV·Filed 2017·Granted Apr 20, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →