Inventor · disambiguated record
Huapeng Huang
Also filed as: HUANG HUAPENG
5 granted patents·2 pending applications·28 citations·filing 2004–2018
75Inventor score
Top patents by PatentIndex Score
7 records- 0182US7236566B2In-situ X-ray diffraction system using sources and detectors at fixed angular positionsGIBSON DAVID M·Filed 2006·Granted Jun 26, 2007·14 cites·18 claims
- 0273US8647705B2Methods for forming superconductor articles and XRD methods for characterizing sameREEVES JODI LYNN·Filed 2012·Granted Feb 11, 2014·1 cites·20 claims
- 0369US7711088B2Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surfaceX RAY OPTICAL SYS INC·Filed 2004·Granted May 4, 2010·10 cites·9 claims
- 0464US11933747B2System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objectsUNIV MARYLAND·Filed 2018·Granted Mar 19, 2024·1 cites·18 claims
- 0558US8130908B2X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing opticHUANG HUAPENG·Filed 2010·Granted Mar 6, 2012·2 cites·12 claims
- 0645US2008159479A1Wide parallel beam diffraction imaging method and systemX RAY OPTICAL SYS INC·Filed 2007·Application pending·0 cites
- 0744US2005014653A1Methods for forming superconductor articles and XRD methods for characterizing sameSUPERPOWER INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →