Inventor · disambiguated record
Tamihide Yasumoto
Also filed as: YASUMOTO TAMIHIDE
3 granted patents·3 pending applications·5 citations·filing 2001–2006
56Inventor score
Top patents by PatentIndex Score
6 records- 0168US7755753B2Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Jul 13, 2010·3 cites·21 claims
- 0264US7948618B2Defect inspection method and apparatus with a threshold value determinationFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted May 24, 2011·2 cites·3 claims
- 0342US2008073523A1Semiconductor wafer defect inspection method and apparatusFUJITSU LTD·Filed 2006·Application pending·0 cites
- 0440US2007035725A1Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereofFUJITSU LTD·Filed 2005·Application pending·0 cites
- 0535US8538131B2Defect inspection apparatus and method of defect inspectionYASUMOTO TAMIHIDE·Filed 2006·Granted Sep 17, 2013·0 cites·4 claims
- 0628US2002098683A1Semiconductor device manufacturing method using metal silicide reaction after ion implantation in silicon wiringFUJITSU LTD·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →