Inventor · disambiguated record
Pyung-Moon Zhang
Also filed as: ZHANG PYUNG-MOON
8 granted patents·2 pending applications·58 citations·filing 2004–2019
84Inventor score
Top patents by PatentIndex Score
10 records- 0173US7002869B2Voltage regulator circuitSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Feb 21, 2006·20 cites·25 claims
- 0271US7443728B2NAND flash memory device and method of programming sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 28, 2008·8 cites·18 claims
- 0366US7975178B2Memory device and system with cyclic, ECC-corrected bootloading operation during voltage bring upSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jul 5, 2011·6 cites·18 claims
- 0462US7167060B2Oscillation circuits including latches for integrated circuit devices and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jan 23, 2007·10 cites·18 claims
- 0560US10783979B2Built-in self-test (BIST) circuit, memory device including the same, and method of operating the BIST circuitSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Sep 22, 2020·1 cites·10 claims
- 0657US10210948B2Built-in self-test (BIST) circuit, memory device including the same, and method of operating the BIST circuitSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 19, 2019·1 cites·19 claims
- 0755US7427888B2Charge pump circuit operating responsive to a modeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 23, 2008·12 cites·15 claims
- 0844US2008204064A1Test system and high voltage measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0933US2011299332A1Test system and high voltage measurement methodZHANG PYUNG-MOON·Filed 2011·Application pending·0 cites
- 1025US8279699B2Semiconductor memory device with reduced power noiseZHANG PYUNG-MOON·Filed 2010·Granted Oct 2, 2012·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →