Inventor · disambiguated record
Jan Liesener
Also filed as: LIESENER JAN
19 granted patents·2 pending applications·156 citations·filing 2008–2022
94Inventor score
Top patents by PatentIndex Score
21 records- 0195US9746348B2Double pass interferometric encoder systemZYGO CORP·Filed 2015·Granted Aug 29, 2017·8 cites·48 claims
- 0294US9719777B1Interferometer with real-time fringe-free imagingZYGO CORP·Filed 2015·Granted Aug 1, 2017·12 cites·24 claims
- 0393US8902431B2Low coherence interferometry with scan error correctionZYGO CORP·Filed 2013·Granted Dec 2, 2014·13 cites·24 claims
- 0493US8379218B2Fiber-based interferometer system for monitoring an imaging interferometerZYGO CORP·Filed 2009·Granted Feb 19, 2013·20 cites·35 claims
- 0590US7978338B2Compound reference interferometerZYGO CORP·Filed 2009·Granted Jul 12, 2011·14 cites·19 claims
- 0688US10066974B2Interferometric encoder systems having at least partially overlapping diffracted beamsZYGO CORP·Filed 2015·Granted Sep 4, 2018·4 cites·38 claims
- 0787US9798130B2Measuring topography of aspheric and other non-flat surfacesZYGO CORP·Filed 2015·Granted Oct 24, 2017·8 cites·45 claims
- 0887US9025161B2Double pass interferometric encoder systemZYGO CORP·Filed 2012·Granted May 5, 2015·4 cites·32 claims
- 0986US8854628B2Interferometric methods for metrology of surfaces, films and underresolved structuresCOLONNA DE LEGA XAVIER M·Filed 2011·Granted Oct 7, 2014·7 cites·42 claims
- 1085US8248617B2Interferometer for overlay measurementsDE GROOT PETER·Filed 2009·Granted Aug 21, 2012·15 cites·24 claims
- 1185US8120781B2Interferometric systems and methods featuring spectral analysis of unevenly sampled dataLIESENER JAN·Filed 2009·Granted Feb 21, 2012·11 cites·26 claims
- 1284US8004688B2Scan error correction in low coherence scanning interferometryZYGO CORP·Filed 2009·Granted Aug 23, 2011·9 cites·41 claims
- 1383US8189202B2Interferometer for determining overlay errorsLIESENER JAN·Filed 2009·Granted May 29, 2012·12 cites·46 claims
- 1479US8456644B2Measurement of changes in surfaces of objectsEVANS CHRISTOPHER J·Filed 2010·Granted Jun 4, 2013·8 cites·40 claims
- 1575US7751064B2Interference objective for annular test surfacesZYGO CORP·Filed 2008·Granted Jul 6, 2010·8 cites·28 claims
- 1669US9201313B2Compact encoder head for interferometric encoder systemZYGO CORP·Filed 2012·Granted Dec 1, 2015·2 cites·31 claims
- 1758US12292274B2Interferometric lens aligner and methodZYGO CORP·Filed 2022·Granted May 6, 2025·0 cites·32 claims
- 1857US9115975B2Position monitoring system with reduced noiseZYGO CORP·Filed 2013·Granted Aug 25, 2015·1 cites·22 claims
- 1952US9891078B2Interferometric encoders using spectral analysisZYGO CORP·Filed 2015·Granted Feb 13, 2018·0 cites·24 claims
- 2039US2012224183A1Interferometric metrology of surfaces, films and underresolved structuresFAY MARTIN·Filed 2012·Application pending·0 cites
- 2139US2012089365A1Data interpolation methods for metrology of surfaces, films and underresolved structuresFAY MARTIN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →