Inventor · disambiguated record
Chih-Jen Chin
Also filed as: CHIN CHIH-JEN
4 granted patents·13 pending applications·1 citations·filing 2008–2023
55Inventor score
Top patents by PatentIndex Score
17 records- 0168US12436190B2Functional testing deviceINVENTEC PUDONG TECH CORP·Filed 2023·Granted Oct 7, 2025·0 cites·9 claims
- 0251US2025086080A1Functional testing methodINVENTEC PUDONG TECH CORP·Filed 2023·Application pending·0 cites
- 0351US2025086081A1Functional testing device and systemINVENTEC PUDONG TECH CORP·Filed 2023·Application pending·0 cites
- 0448US9037909B2Test apparatusINVENTEC PUDONG TECH CORP·Filed 2013·Granted May 19, 2015·1 cites·7 claims
- 0534US7940068B2Test boardINVENTEC CORP·Filed 2009·Granted May 10, 2011·0 cites·6 claims
- 0634US2020386812A1Server switch system including field-programmable gate array unit for processing data and operation method thereofINVENTEC PUDONG TECH CORP·Filed 2019·Application pending·0 cites
- 0733US2022155966A1Hybrid Cluster System and Computing Node ThereofINVENTEC PUDONG TECH CORP·Filed 2020·Application pending·0 cites
- 0830US8074114B2Motherboard error detection systemCHIN CHIH-JEN·Filed 2009·Granted Dec 6, 2011·0 cites·7 claims
- 0930US2012137179A1Processing system for monitoring power-on self-test informationCHIN CHIH-JEN·Filed 2011·Application pending·0 cites
- 1030US2009189637A1Machine for programming on-board chipsetsINVENTEC CORP·Filed 2008·Application pending·0 cites
- 1128US2012137027A1System and method for monitoring input/output port status of peripheral devicesZHENG QUAN-JIE·Filed 2011·Application pending·0 cites
- 1225US2012137159A1Monitoring system and method of power sequence signalCHIN CHIH-JEN·Filed 2011·Application pending·0 cites
- 1325US2012133374A1Method for detecting capacitor lossCHIN CHIH-JEN·Filed 2011·Application pending·0 cites
- 1424US2010049903A1Recording system and data recording methodCHIN CHIH-JEN·Filed 2008·Application pending·0 cites
- 1523US2013162273A1Testing deviceCHIN CHIH-JEN·Filed 2012·Application pending·0 cites
- 1622US2012131385A1Testing mehtod for unit under testCHIN CHIH-JEN·Filed 2010·Application pending·0 cites
- 1720US2012131403A1Multi-chip test system and test method thereofCHIN CHIH-JEN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →