Inventor · disambiguated record
David Randall
Also filed as: RANDALL DAVID · RANDALL DAVID WINSLOW
5 granted patents·119 citations·filing 2002–2010
83Inventor score
Top patents by PatentIndex Score
5 records- 0193US8111900B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleWU KENONG·Filed 2010·Granted Feb 7, 2012·27 cites·17 claims
- 0289US7729529B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleKLA TENCOR TECH CORP·Filed 2004·Granted Jun 1, 2010·39 cites·19 claims
- 0382US7072786B2Inspection system setup techniquesKLA TENCOR TECH CORP·Filed 2005·Granted Jul 4, 2006·9 cites·18 claims
- 0481US7142992B1Flexible hybrid defect classification for semiconductor manufacturingKLA TENCOR TECH CORP·Filed 2004·Granted Nov 28, 2006·28 cites·19 claims
- 0572US6959251B2Inspection system setup techniquesKLA TENCOR TECH CORP·Filed 2002·Granted Oct 25, 2005·16 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →