Inventor · disambiguated record
Gabriel Baralia
Also filed as: BARALIA GABRIEL
8 granted patents·1 pending application·11 citations·filing 2013–2024
79Inventor score
Top patents by PatentIndex Score
9 records- 0179US8769709B2Apparatus and method for analyzing and modifying a specimen surfaceZEISS CARL SMS GMBH·Filed 2013·Granted Jul 1, 2014·4 cites·20 claims
- 0276US2024272198A1Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0375US10983075B2Device and method for analysing a defect of a photolithographic mask or of a waferZEISS CARL SMT GMBH·Filed 2017·Granted Apr 20, 2021·1 cites·11 claims
- 0473US9910065B2Apparatus and method for examining a surface of a maskZEISS CARL SMT GMBH·Filed 2016·Granted Mar 6, 2018·2 cites·39 claims
- 0572US11977097B2Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2022·Granted May 7, 2024·0 cites·31 claims
- 0672US10578644B2Probe system and method for receiving a probe of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2017·Granted Mar 3, 2020·1 cites·24 claims
- 0772US9115981B2Apparatus and method for investigating an objectZEISS CARL SMS GMBH·Filed 2013·Granted Aug 25, 2015·3 cites·25 claims
- 0870US11733186B2Device and method for analyzing a defect of a photolithographic mask or of a waferZEISS CARL SMT GMBH·Filed 2021·Granted Aug 22, 2023·0 cites·32 claims
- 0969US11353478B2Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2019·Granted Jun 7, 2022·0 cites·28 claims
Join the waitlist — get patent alerts
Get an alert when Gabriel Baralia files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →