Inventor · disambiguated record
Travis S. Ellis
Also filed as: ELLIS TRAVIS · ELLIS TRAVIS S · ELLIS TRAVIS SCOTT
10 granted patents·3 pending applications·167 citations·filing 2000–2017
89Inventor score
Top patents by PatentIndex Score
13 records- 0193US9705273B2Direct-attach connectorSAMTEC INC·Filed 2014·Granted Jul 11, 2017·16 cites·21 claims
- 0292US9040824B2Twinaxial cable and twinaxial cable ribbonGUETIG KEITH·Filed 2012·Granted May 26, 2015·67 cites·20 claims
- 0386US7544093B2Compliant coaxial connectorSAMTEC INC·Filed 2007·Granted Jun 9, 2009·29 cites·20 claims
- 0477US6794887B1Test head including displaceable switch elementCREDENCE SYSTEMS CORP·Filed 2001·Granted Sep 21, 2004·26 cites·9 claims
- 0574US9645172B2Cable assemblySAMTEC INC·Filed 2014·Granted May 9, 2017·9 cites·27 claims
- 0667US6329892B1Low profile, current-driven relay for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 2000·Granted Dec 11, 2001·14 cites·9 claims
- 0764US11146002B2Direct-attach connectorSAMTEC INC·Filed 2017·Granted Oct 12, 2021·2 cites·20 claims
- 0855US8063725B2Form C relay and package using sameELLIS TRAVIS S·Filed 2009·Granted Nov 22, 2011·4 cites·5 claims
- 0953US10170882B2Direct-attach connectorSAMTEC INC·Filed 2017·Granted Jan 1, 2019·0 cites·21 claims
- 1050US2015228378A1Twinaxial cable and twinaxial cable ribbonSAMTEC INC·Filed 2015·Application pending·0 cites
- 1149US10164394B2Direct-attach connectorSAMTEC INC·Filed 2017·Granted Dec 25, 2018·0 cites·21 claims
- 1240US2009085591A1Probe tip including a flexible circuit boardSAMTEC INC·Filed 2008·Application pending·0 cites
- 1336US2006290361A1A semiconductor integrated circuit tester channel with selective bypass circuitryELLIS TRAVIS·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →