Inventor · disambiguated record
Nicholas Bottka
Also filed as: BOTTKA NICHOLAS
15 granted patents·341 citations·filing 1975–1992
94Inventor score
Top patents by PatentIndex Score
15 records- 0195US4454835AInternal photolysis reactorUS NAVY·Filed 1982·Granted Jun 19, 1984·87 cites·5 claims
- 0278US3973216ALaser with a high frequency rate of modulationUS NAVY·Filed 1975·Granted Aug 3, 1976·20 cites·9 claims
- 0371US5379109AMethod and apparatus for non-destructively measuring local resistivity of semiconductorsUS ARMY·Filed 1992·Granted Jan 3, 1995·62 cites·20 claims
- 0461US4953983ANon-destructively measuring local carrier concentration and gap energy in a semiconductorBOTTKA NICHOLAS·Filed 1988·Granted Sep 4, 1990·24 cites·14 claims
- 0560US4218143ALattice matching measurement deviceUS NAVY·Filed 1979·Granted Aug 19, 1980·13 cites·20 claims
- 0659US5365334AMicro photoreflectance semiconductor wafer analyzerUS ARMY·Filed 1990·Granted Nov 15, 1994·30 cites·12 claims
- 0756US4403397AMethod of making avalanche photodiodesUS NAVY·Filed 1981·Granted Sep 13, 1983·21 cites·7 claims
- 0853US3976873ATunable electroabsorptive detectorUS NAVY·Filed 1975·Granted Aug 24, 1976·21 cites·4 claims
- 0952US4144540ATunable infrared detector with narrow bandwidthUS NAVY·Filed 1978·Granted Mar 13, 1979·15 cites·9 claims
- 1047US4492434AMulti-color tunable semiconductor deviceUS NAVY·Filed 1982·Granted Jan 8, 1985·12 cites·11 claims
- 1144US4524090ADeposition of compounds from multi-component organo-metalsUS NAVY·Filed 1984·Granted Jun 18, 1985·10 cites·6 claims
- 1243US4508590AMethod for the deposition of high-quality crystal epitaxial films of ironKAPLAN RAPHAEL·Filed 1983·Granted Apr 2, 1985·8 cites·15 claims
- 1341US3995155AIntegrated optical data bus couplerUS NAVY·Filed 1975·Granted Nov 30, 1976·7 cites·6 claims
- 1434US4316206ATwo color narrow bandwidth detectorUS NAVY·Filed 1980·Granted Feb 16, 1982·6 cites·7 claims
- 1532US4350413AMulti-color tunable filterUS NAVY·Filed 1980·Granted Sep 21, 1982·5 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →