Inventor · disambiguated record
Nadav Wertsman
Also filed as: WERTSMAN NADAV
4 granted patents·1 pending application·21 citations·filing 2005–2016
72Inventor score
Top patents by PatentIndex Score
5 records- 0192US10061192B2Method and apparatus for correcting errors on a wafer processed by a photolithographic maskZEISS CARL SMT GMBH·Filed 2016·Granted Aug 28, 2018·6 cites·23 claims
- 0287US9436080B2Method and apparatus for correcting errors on a wafer processed by a photolithographic maskBEYER DIRK·Filed 2011·Granted Sep 6, 2016·9 cites·19 claims
- 0363US8836780B2Process control and manufacturing method for fan out wafersWEISS TOMMY·Filed 2011·Granted Sep 16, 2014·5 cites·22 claims
- 0448US7317523B2Method for calibrating a metrology tool and a systemAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jan 8, 2008·1 cites·12 claims
- 0539US2009273669A1Method and system for detecting critical defectsWERTSMAN NADAV·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →