Inventor · disambiguated record
Clemente Bottini
Also filed as: BOTTINI CLEMENTE
9 granted patents·1 pending application·6 citations·filing 2007–2013
79Inventor score
Top patents by PatentIndex Score
10 records- 0163US7542136B2Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughputIBM·Filed 2007·Granted Jun 2, 2009·1 cites·3 claims
- 0262US7742160B2Determining angle of incidence with respect to workpieceIBM·Filed 2008·Granted Jun 22, 2010·4 cites·20 claims
- 0356US8680871B2Alignment correction system and method of useIBM·Filed 2013·Granted Mar 25, 2014·0 cites·8 claims
- 0456US8411270B2Monitoring stage alignment and related stage and calibration targetZANGOOIE SHAHIN·Filed 2008·Granted Apr 2, 2013·1 cites·19 claims
- 0555US8736275B2Alignment correction system and method of useIBM·Filed 2013·Granted May 27, 2014·0 cites·8 claims
- 0654US7592817B2Alignment correction system and method of useIBM·Filed 2007·Granted Sep 22, 2009·0 cites·2 claims
- 0753US7477365B2Optical spot geometric parameter determination using calibration targetsIBM·Filed 2007·Granted Jan 13, 2009·0 cites·7 claims
- 0852US8451008B2Alignment correction system and method of useFOSTER ROBERT J·Filed 2009·Granted May 28, 2013·0 cites·24 claims
- 0950US2009027660A1Optical spot geometric parameter determination using calibration targetsZANGOOIE SHAHIN·Filed 2008·Application pending·0 cites
- 1040US7646491B2Determining azimuth angle of incident beam to waferIBM·Filed 2007·Granted Jan 12, 2010·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →