Inventor · disambiguated record
Goroku Shimoma
Also filed as: SHIMOMA GOROKU
3 granted patents·83 citations·filing 1998–2004
73Inventor score
Technology areasH01J
Top patents by PatentIndex Score
3 records- 0191US6791084B2Method and scanning electron microscope for measuring dimension of material on sampleHITACHI HIGH TECH CORP·Filed 2002·Granted Sep 14, 2004·51 cites·7 claims
- 0273US6166380AResolving power evaluation method and specimen for electron microscopeHITACHI LTD·Filed 1998·Granted Dec 26, 2000·30 cites·9 claims
- 0353US7385196B2Method and scanning electron microscope for measuring width of material on sampleHITACHI HIGH TECH CORP·Filed 2004·Granted Jun 10, 2008·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →