Inventor · disambiguated record
Ivo Rangelow
Also filed as: RANGELOW IVO · RANGELOW IVO W
15 granted patents·5 pending applications·65 citations·filing 2001–2022
90Inventor score
Top patents by PatentIndex Score
20 records- 0191US8997258B2Microscope probe and method for use of sameNAT INST OF STANDARDS & TECH·Filed 2014·Granted Mar 31, 2015·14 cites·20 claims
- 0273US7946029B2Apparatus for aligning a first article relative to a second articleUNI KASSEL·Filed 2005·Granted May 24, 2011·7 cites·12 claims
- 0372US8312561B2Device and method for the micromechanical positioning and handling of an objectRANGELOW IVO W·Filed 2008·Granted Nov 13, 2012·9 cites·17 claims
- 0471US8546264B2Etching radical controlled gas chopped deep reactive ion etchingOLYNICK DEIRDRE·Filed 2006·Granted Oct 1, 2013·7 cites·20 claims
- 0567US7126139B2Device and method of positionally accurate implantation of individual particles in a substrate surfaceUNIV CALIFORNIA·Filed 2003·Granted Oct 24, 2006·7 cites·27 claims
- 0664US10025207B2Method of aligning a first article relative to a second articleRANGELOW IVO·Filed 2011·Granted Jul 17, 2018·2 cites·12 claims
- 0762US7141808B2Device and method for maskless AFM microlithographyRANGELOW IVO·Filed 2003·Granted Nov 28, 2006·8 cites·23 claims
- 0855US7183043B2Shadow mask and method for producing a shadow maskUNI KASSEL·Filed 2001·Granted Feb 27, 2007·6 cites·15 claims
- 0952US8689359B2Apparatus and method for investigating surface properties of different materialsRANGELOW IVO W·Filed 2008·Granted Apr 1, 2014·3 cites·11 claims
- 1048US8128282B2Microsystem component with a device deformable under the effect of temperature changesRANGELOW IVO·Filed 2006·Granted Mar 6, 2012·2 cites·22 claims
- 1146US11906546B2Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imagingMASSACHUSETTS INST TECHNOLOGY·Filed 2020·Granted Feb 20, 2024·0 cites·13 claims
- 1242US2024103373A1A stepper lithography apparatus and operating method therefor, and pattern alignment devicePARCAN NANOTECH CO LTD·Filed 2021·Application pending·0 cites
- 1342US2023296990A1Sub-nanoscale high-precision lithography writing field stitching method, lithography system, wafer, and electron beam drift determination methodPARCAN NANOTECH CO LTD·Filed 2022·Application pending·0 cites
- 1439US9161429B2Compact ion source neutron generatorSCHENKEL THOMAS·Filed 2012·Granted Oct 13, 2015·0 cites·14 claims
- 1539US2025067776A1Probe devices and probe control apparatusPARCAN NANOTECH CO LTD·Filed 2022·Application pending·0 cites
- 1638US2025130251A1Probe device, probe control apparatus and methodPARCAN NANOTECH CO LTD·Filed 2022·Application pending·0 cites
- 1737US11798987B2Substrate for a controlled implantation of ions and method of preparing a substrate for a controlled implantation of ionsPARCAN NANOTECH CO LTD·Filed 2020·Granted Oct 24, 2023·0 cites·18 claims
- 1835US2006238206A1Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contactsSUSS MICRO TEC SYSTEMS GMBH·Filed 2004·Application pending·0 cites
- 1932US8479311B2Device and method for an atomic force microscope for the study and modification of surface propertiesKUBSKY STEFAN·Filed 2008·Granted Jul 2, 2013·0 cites·18 claims
- 2031US8466061B2Method for forming a through via in a semiconductor element and semiconductor element comprising the sameKOLB STEFAN·Filed 2010·Granted Jun 18, 2013·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →