Inventor · disambiguated record
Johannes K. Zettler
Also filed as: ZETTLER JOHANNES K · ZETTLER JOHANNES KRISTIAN
1 granted patent·1 pending application·1 citations·filing 2010–2023
15Inventor score
Top patents by PatentIndex Score
2 records- 0155US8233158B2Method and apparatus for determining the layer thickness and the refractive index of a sampleZETTLER JOERG-THOMAS·Filed 2010·Granted Jul 31, 2012·1 cites·15 claims
- 0242US2024027184A1Method and Apparatus for Measuring the Thickness of a Transparent Layer on Nanometer ScaleLAYTEC AG·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →