Inventor · disambiguated record
Christianus Gerardus Maria De Mol
Also filed as: DE MOL CHRISTIANUS G M · DE MOL CHRISTIANUS GERARDUS MA · DE MOL CHRISTIANUS GERARDUS MARIA
18 granted patents·1 pending application·142 citations·filing 2001–2021
94Inventor score
Files withASML NETHERLANDS BV15CADEE THEODORUS PETRUS MARIA2ASM LITHOGRAPHY BV1MOS EVERHARDUS CORNELIS1
Top patents by PatentIndex Score
19 records- 0196US7804575B2Lithographic apparatus and device manufacturing method having liquid evaporation controlASML NETHERLANDS BV·Filed 2005·Granted Sep 28, 2010·23 cites·44 claims
- 0294US11378893B2Lithographic apparatus and device manufacturing method involving a heaterASML NETHERLANDS BV·Filed 2020·Granted Jul 5, 2022·2 cites·20 claims
- 0390US10996176B2Methods and apparatus for measuring a property of a substrateASML NETHERLANDS BV·Filed 2020·Granted May 4, 2021·2 cites·19 claims
- 0490US6563564B2Method of operating an optical imaging system, lithographic projection apparatus, device manufacturing method, and device manufactured therebyASM LITHOGRAPHY BV·Filed 2001·Granted May 13, 2003·58 cites·22 claims
- 0589US10317191B2Methods and apparatus for measuring a property of a substrateASML NETHERLANDS BV·Filed 2017·Granted Jun 11, 2019·4 cites·21 claims
- 0689US9188880B2Lithographic apparatus and device manufacturing method involving a heaterCADEE THEODORUS PETRUS MARIA·Filed 2011·Granted Nov 17, 2015·4 cites·32 claims
- 0788US9268242B2Lithographic apparatus and device manufacturing method involving a heater and a temperature sensorCADEE THEODORUS PETRUS MARIA·Filed 2010·Granted Feb 23, 2016·4 cites·38 claims
- 0888US7649614B2Method of characterization, method of characterizing a process operation, and device manufacturing methodASML NETHERLANDS BV·Filed 2006·Granted Jan 19, 2010·11 cites·20 claims
- 0986US10838310B2Lithographic apparatus and device manufacturing method involving a heaterASML NETHERLANDS BV·Filed 2019·Granted Nov 17, 2020·1 cites·20 claims
- 1086US7916275B2Methods of characterizing similarity or consistency in a set of entitiesASML NETHERLANDS BV·Filed 2007·Granted Mar 29, 2011·9 cites·31 claims
- 1185US10746668B2Methods and apparatus for measuring a property of a substrateASML NETHERLANDS BV·Filed 2019·Granted Aug 18, 2020·2 cites·27 claims
- 1283US9594029B2Methods and apparatus for measuring a property of a substrateASML NETHERLANDS BV·Filed 2012·Granted Mar 14, 2017·4 cites·16 claims
- 1381US8612045B2Optimization method and a lithographic cellMOS EVERHARDUS CORNELIS·Filed 2009·Granted Dec 17, 2013·7 cites·12 claims
- 1474US11977034B2Methods and apparatus for measuring a property of a substrateASML NETHERLANDS BV·Filed 2021·Granted May 7, 2024·0 cites·18 claims
- 1571US7889318B2Methods of characterizing similarity between measurements on entities, computer programs product and data carrierASML NETHERLANDS BV·Filed 2008·Granted Feb 15, 2011·3 cites·23 claims
- 1669US7480028B2Lithographic apparatus for imaging a front side or a back side of a substrate, method of substrate identification, device manufacturing method, substrate, and computer programASML NETHERLANDS BV·Filed 2005·Granted Jan 20, 2009·3 cites·26 claims
- 1763US10254663B2Lithographic apparatus and device manufacturing method involving a heaterASML NETHERLANDS BV·Filed 2015·Granted Apr 9, 2019·0 cites·38 claims
- 1858US7410735B2Method of characterization, method of characterizing a process operation, and device manufacturing methodASML NETHERLANDS BV·Filed 2004·Granted Aug 12, 2008·5 cites·31 claims
- 1930US2005195378A1Lithographic apparatus, method of substrate identification, device manufacturing method, substrate, and computer programASML NETHERLANDS BV·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →