Inventor · disambiguated record
Igor Turovets
Also filed as: TUROVETS IGOR
17 granted patents·2 pending applications·308 citations·filing 1995–2021
92Inventor score
Top patents by PatentIndex Score
19 records- 0192US10216098B2Test structure for use in metrology measurements of patternsNOVA MEASURING INSTR LTD·Filed 2015·Granted Feb 26, 2019·8 cites·18 claims
- 0291US10066936B2Test structures and metrology technique utilizing the test structures for measuring in patterned structuresNOVA MEASURING INSTR LTD·Filed 2015·Granted Sep 4, 2018·8 cites·22 claims
- 0384US11143601B2Test structure design for metrology measurements in patterned samplesNOVA LTD·Filed 2019·Granted Oct 12, 2021·2 cites·8 claims
- 0478US6620160B2Method and device for electro microsurgery in a physiological liquid environmentNANOPTICS INC·Filed 2002·Granted Sep 16, 2003·81 cites·15 claims
- 0576US9528946B2Optical metrology for in-situ measurementsNOVA MEASURING INSTR LTD·Filed 2013·Granted Dec 27, 2016·2 cites·26 claims
- 0675US10295329B2Monitoring system and method for verifying measurements in patterned structuresBRILL BOAZ·Filed 2012·Granted May 21, 2019·3 cites·21 claims
- 0774US11639901B2Test structure design for metrology measurements in patterned samplesNOVA LTD·Filed 2021·Granted May 2, 2023·0 cites·11 claims
- 0874US6352535B1Method and a device for electro microsurgery in a physiological liquid environmentNANOPTICS INC·Filed 1997·Granted Mar 5, 2002·174 cites·25 claims
- 0970US12152869B2Monitoring system and method for verifying measurements in patterned structuresNOVA LTD·Filed 2021·Granted Nov 26, 2024·0 cites·22 claims
- 1070US10197506B2Optical metrology for in-situ measurementsNOVA MEASURING INSTR LTD·Filed 2018·Granted Feb 5, 2019·1 cites·20 claims
- 1168US9915624B2Optical metrology for in-situ measurementsNOVA MEASURING INSTR LTD·Filed 2016·Granted Mar 13, 2018·1 cites·24 claims
- 1263US10226852B2Surface planarization system and methodNOVA MEASURING INSTR LTD·Filed 2014·Granted Mar 12, 2019·1 cites·17 claims
- 1356US2019339056A1Monitoring system and method for verifying measurements in pattened structuresNOVA MEASURING INSTR LTD·Filed 2019·Application pending·0 cites
- 1450US2017146465A1Test structure design for metrology measurements in patterned samplesNOVA MEASURING INSTR LTD·Filed 2015·Application pending·0 cites
- 1549US12498332B2Imaging metrologyNOVA LTD·Filed 2021·Granted Dec 16, 2025·0 cites·19 claims
- 1646US11335612B2Apparatus and method for electrical test predictionNOVA LTD·Filed 2018·Granted May 17, 2022·0 cites·20 claims
- 1744US12165023B2Measuring local CD uniformity using scatterometry and machine learningNOVA LTD·Filed 2021·Granted Dec 10, 2024·0 cites·17 claims
- 1840US10978321B2Method and system for processing patterned structuresNOVA MEASURING INSTR LTD·Filed 2016·Granted Apr 13, 2021·0 cites·30 claims
- 1938US6039726AMethod and apparatus for concentrating laser beamsNANOPTICS INC·Filed 1995·Granted Mar 21, 2000·27 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →